ICS 105 set 四轴IC集成芯片 近场辐射扫描仪

(50 x 50 x 50) mm / α-Rotation ±180°

(10 x 10 x 10) µm / α-Rotation 1°

(2 x 2 x 2) mm/s / α-Rotation 45°/s

微型近场探头 ICR E150：可用频率7 MHz – 3 GHz

ICR HH H Field（接收垂直方向的磁场线）；

HH100中的“100” 代表 探头 尖端 的 内部 直径（ μ m）

ICR HH H Field（接收垂直方向的磁场线）

HH100代表探头尖端的内部直径(μm)；

ICR HH100-27：可用频率 1.5 MHz – 6 GHz

ICR HH100-6：可用频率 2.5 MHz – 6 GHz

ICR HH150-27：可用频率1.5 MHz – 6 GHz

ICR HH150-6：可用频率 2.5 MHz – 6 GHz

ICR HH250-6：可用频率 2.5 MHz – 6 GHz

ICR HH250-75：可用频率 0.5 MHz – 2GHz

ICR HH500-6：可用频率 2 MHz – 6 GHz

ICR HH500-75：可用频率 200kHz – 1 GHz

ICR HV H Field（接收水平方向的磁场线）

HV100代表探头尖端的内部直径(μm)；

ICR HV100-27：可用频率 1.5 MHz – 6 GHz

ICR HV100-6：可用频率 2.5 MHz – 6 GHz

ICR HV150-27：可用频率1.5 MHz – 6 GHz

ICR HV150-6：可用频率 2.5 MHz – 6 GHz

ICR HV250-6：可用频率 2.5 MHz – 6 GHz

ICR HV250-75：可用频率 0.5 MHz – 2GHz

ICR HV500-6：可用频率 2 MHz – 6 GHz

ICR HV500-75：可用频率 200kHz – 1 GHz

含电场和磁场

LFS 序列（<50MHz）

RFS序列（<3GHz）

XFS 序列（<6GHz）

序列一、LFS, Passive, 100 kHz up to 50 MHz

LFS-B 3： 100 kHz up to 50 MHz

序列二、RFS, Passive, 30 MHz up to 3 GHz

RFS扫描探头组包含三个无源近场探头，用于在研发阶段扫描测量电场和磁场，频率范围为30MHz到3GHz。该探头组的探头可以实现紧贴电子模块测量，从而定位干扰信号源。它们记录受测物的近电场和近磁场的整个图形。该扫描探头组具备外片电流衰减和电屏蔽。扫描探头可以接到频谱分析仪或示波器的50Ω输入端。探头内部没有50Ω的终端阻抗。扫描探头的测量信号可以通过PA 203或PA 303型前置放大器放大。根据需求生产RFS，LFS，SXS 和XFS型扫描探头。

以下RFS序列不同的探头均具有不同的探头尺寸，可以按需选购或全配置。

RFS-R 50-1, Scanner Probe 30 MHz up to 3 GHz

The RFS-R 50-1 H-field probe is designed for taking field measurements on assemblies, devices or cables at a distance of up to approx. 3 cm. The H-field probe can be used to identify larger components as sources of interference.

RFS-R 3-2, Scanner Probe 30 MHz up to 3 GHz

RFS-R 0.3-3, Scanner Probe 30 MHz up to 3 GHz

RFS-B 3-2, Scanner Probe 30 MHz up to 3 GHz

The measurement coil of the RFS-B 3-2 H-field probe is arranged orthogonally to the probe shaft. This allows the probe head to be positioned very close to the assembly and to achieve a strong coupling. The RFS-B 3-2 detects magnetic field lines, which exit the measuring object othogonally. Magnetic …

RFS-B 0.3-3, Scanner Probe 30 MHz up to 3 GHz

RFS-E 02, Scanner Probe 30 MHz up to 3 GHz

RFS-E 03, Scanner Probe 30 MHz up to 3 GHz

Using the approx. 4×4 mm electrode, which is located in the bottom of the RFS-E 03 probe head, E-fields from clocked lines, IC pins, and smaller components can be detected.

RFS-E 05, Scanner Probe 30 MHz up to 3 GHz

RFS-E 10, Scanner Probe 30 MHz up to 3 GHz

序列三、XFS, Passive, 30 MHz – 6 GHz

以下XFS序列不同的探头均具有不同的探头尺寸，可以按需选购或全配置。

XFS-R 3-1, Scanner Probe 30 MHz up to 6 GHz

The XFS-R 3-1 near-field probe is designed for direct high-resolution measurements of RF magnetic fields on an assembly, e.g. around the pins and IC cases, conducting paths, decoupling capacitor, and EMC components.

XFS-B 3-1, Scanner Probe 30 MHz up to 6 GHz

The measurement coil of the XFS-B 3-1 H-field probe is set at a 90° angle to the probe shaft. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly. This allows for use at places on the surface of printed circuit boards, which are t…

XFS-E 10, Scanner Probe 30 MHz up to 6 GHz

The electrode in the probe head of the XFS-E 10 has a width of approx. 0.2 mm. With the probe even smallest E-field sources can be located, e.g. conducting paths with a width of 0.1 mm or single pins on multi pinned ICs. To measure, the E-field probe is positioned onto the object.

XFS-E 09s, Scanner Probe 30 MHz up to 6 GHz

The electrode on the probe head of the XFS-E 09 detects electrical fields which, for example are decoupled above the IC’s surface. The probe’s resolution allows for measurements with a distance of 0.5 mm to 10 mm above an assembly.