- Shenzhen EUTTEST Technology Co.,Ltd.
- Electromagnetic test equipment
- EUT TEST
This catalog summarizes the instructions prepared by our company on how to test ICs for electromagnetic compatibility EMC. You can learn here the flow of standardized EMC testing of IC chips, including the design of test-adapted PCB boards, how the chip under test works, and other professional knowledge.
Integrated circuits (ICs) are often the ultimate source of unintentional electromagnetic radiation from electronic devices and systems. However, ICs are too small to radiate on their own. In order to radiate a field strong enough to cause interference problems, the IC IC's EMC interference coupling method must couple energy from the IC package through conduction coupling, electric field coupling...
Users of IC integrated circuits are able to compare various types of ICs based on their EMC parameters. IC developers should have a good understanding of the EMC test programs and test equipment for IC integrated circuits, with the goal of identifying those parameters that are decisive for EMC immunity and radiation, and allow engineers to provide the...
EMC problems during the development of electronic modules for the automotive industry lead to very high development costs and time loss, so the EMC requirements of automotive electronics for IC chips on-board chips need to meet certain standard limits. This is why more and more highly integrated, ESD-sensitive ICs...
The effects of EMC on chip functionality can vary widely, ranging from transient tolerable failures (e.g., short-time switching of port outputs) to complete IC failures, i.e., permanent loss of functionality. This paper discusses conducted interference via IC pins and IC integrated circuit chips subjected to electromagnetic field coupling induced ...
This paper presents an evaluation of the effects of ESD static electricity on IC integrated circuit chips, ICs are often the cause of interference emissions or immunity weaknesses where it is difficult to control them. Over time, the structure of ICs has become smaller, which leads to higher switching rates and the need to reduce the supply voltage...
This paper describes the IC EMC problems stemming from the sensitivity of ICs to fast pulses increases significantly with their structural dimensions, operating voltages, and fewer operating points, and shows that improving the EMC performance of ICs should start with compliance with the IEC standard, and that the user needs to create a forcing in the development process....
The EMC standard for ICs (IEC 62132) provides three typical measurement methods for such characterization: the DPI (Direct Power Injection) method, the TEM cell (Transverse Electromagnetic Cell) method, and the use of IC strip lines. This paper examines IC integrated circuits in more detail...
The analysis of EMC testing from device to chip consists of two parts. The advantage of analyzing immunity at the IC level is that there is no need to take into account the influence of the device design on EMC. This includes, for example, the design of the printed circuit board, the nature and availability of connectors, or the enclosure construction. In addition, when testing IC immunity...
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