IEC 61967-1 Integrated circuits. Measurement of electromagnetic radiation Part 1 Explanation of the standard

Standards Profile:

IEC 61967-1:2018 is available as IEC 61967-1:2018 RLV which contains the International Standard and its revisions showing all changes in technical content from the previous edition.

IEC 61967-1:2018 provides general information and definitions concerning the measurement of conducted and radiated electromagnetic disturbances on integrated circuits. It also provides descriptions of measurement conditions, test equipment and setup, and test procedures and test report contents. A test method comparison table is included in Appendix A to assist in the selection of appropriate measurement methods. The purpose of this document is to describe the general conditions for establishing a uniform test environment and obtaining quantitative measurements of integrated circuit (IC) RF interference. Key parameters that are expected to affect test results are described. Deviations from this document are clearly noted in a separate test report. Measurement results may be used for comparison or other purposes. Measurements of voltages and currents of conducted RF emissions or radiated RF interference from integrated circuits under controlled conditions generate information about the likelihood of RF interference in integrated circuit applications. The applicable frequency ranges are described in each part of IEC 61967.

This release includes the following major technical changes from the previous version:

- The frequency range of 150 kHz to 1 GHz has been deleted from the title.

- Addition of frequency steps above 1 GHz in Tables 1, 2 and 5.4.

- Division of Table A.1 into two tables and addition of IEC 61967-8 to Table A.2 in Appendix A.

- The general test board description has been moved to Appendix D.

Updated standards:

The standard check was renewed in April 2024.

• IEC 61967-1:2018 Integrated circuits . Measurement of electromagnetic radiation . Part 1: General conditions and definitions .
• IEC 61967-1: 2018 Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions definitions

Standards revision history:

Standard Catalog:

8.5 Software description. 16

8.6 Data presentation. 16

8.6.1 General 16

8.6.2 Graphical representation. 16

8.6.3 Measurement data. 16

8.6.4 Data processing16

8.7 RF emission limits.16

8.8 Interpretation of results. 16

8.8.1 Comparison between ICs using the same test method16

8.8.2 Comparison between different test methods.16

8.8.3 Correlation with Module Test Methods16

Appendix A (Informative) Test Method Comparison Table17

Appendix B (Informative) Flow Chart of Counter Test Codes.19

Annex C (Informative) Worst-case scenario application note. 20

Annex D (Informative) General Test Committee Note. 21

D. 1 General. . 21

D, 2 plate description - mechanical. 21

D. 3. Board Description-Electrical. . 21

D. 4. Ground aircraft 21

D, 5 packing pins. 22

D. 5.1 Overview22

D, 5.2 DIL package 22

D, 5.3 SOP, PLCC, QFP package 22

D, 5.4 PGA package. 22

D, 5.5 BGA package. 22

D, 6 through diameter. 22

D. 7 Passing distance. 22

D. 8. Add-on 22

D, 9 Supply dismantling. 22

D. 9.1 Overview22

D, 9.2 IC decoupling capacitors. 23

D. 9.3 Power disconnect for test board 23

D, 10 I/O loads. 23

Bibliography. 25

Figure B.1-Test Code Flow Diagram 19

Figure D.1-Emission test board example.24

Table 1-Measurement Receiver Band and Resolution Bandwidth (RBW) Default Settings.11

Table 2-Spectrum Analyzer Band and RBW Default Settings.12

Table 3-IC Pin Loading Recommendations14

Table A.1 - Conducted emissions.17

Table A.2 - Radiation Emissions18

Table D.1 - Location of Through Holes in Plates21

Preamble 4

1 Range 6

2 Normative references6

3 Terms and definitions6

4 Test conditions. 10

4.1 Overview. 10

4.2 Environmental conditions10

4.2.1 Overview10

4.2.2 Ambient temperature11

4.2.3 Ambient RF field strength11

4.2.4 Other environmental conditions

4.2.5 IC stability over time.11

5 Test equipment. 11

5.1 General. 11

5.2 Shielding 11

5.3 RF Measurement Instruments. 11

5.3.1 Overview11

5.3.2 Measuring receivers11

5.3.3 Spectrum analyzer. 12

5.3.4 Other RBW for narrowband emissions.12

5.3.5. emission type, detector type and sweep speed. 12

5.3.6 Video bandwidth. 12

5.3.7 Validation of RF measurement instrument calibration.12

5.4 Frequency range13

5.5 Preamplifier or attenuator. 13

5.6 System Gain .13

5.7 Other components13

6 Test setup. 13

6.1 General. 13

6.2 Testing the board. 13

6.3 IC pin loading. .13

6.4 Power Requirements-Test Board Power Supply. 14

6.5 IC Specific Considerations. 14

6.5.1 IC Supply Voltage.14

6.5.2 IC disconnection14

6.5.3 Activities of IC. 14

6.5.4 IC Operating Guidelines. 14

7 Test program. 15

7.1 Ambient radio frequency noise inspection15

7.2 Operational checks. 15

7.3 Specific procedures15

8 Test Report 15

8.1 General. 15

8.2 Ambient radio frequency noise. 15

8.3 Description of equipment. 15

8.4 Setup instructions16

Standard text:

This part of IEC 61967 provides general information and definitions concerning the measurement of conducted and radiated electromagnetic interference on integrated circuits. It also provides a description of the measurement conditions, test equipment and setup, as well as the contents of test procedures and test reports. A comparison table of test methods is included in Annex A to assist in the selection of a suitable measurement method.

The purpose of this document is to describe the general conditions for establishing a uniform test environment and obtaining quantitative measurements of integrated circuit (IC) RF interference. Key parameters that are expected to affect test results are described.

Deviations from this document are clearly indicated in the individual test reports. Measurements may be used for comparison or other purposes.

Measurement of voltages and currents from conducted RF emissions or radiated RF interference from integrated circuits under controlled conditions provides information about potential RF interference in integrated circuit applications.

Each part of IEC 61967 describes the applicable frequency range.

Please buy the original document to see more, this article is only an introduction.