Introduction to ICI Sequential Probes:
EUTTEST, as an authorized distributor of Langer EMV-Technik GMBH, has been offering langer's ICI series of injection probes for many years, which allow users to inject Electromagnetic Failure Interference (EMFI) signals into encrypted circuits and protocols with the ICI probes. Now, the ICI-DP series extends this. In addition to stronger interference effects, the new EMFI test system can now generate two interference pulses in rapid succession.
In addition to improved interference parameters, Langer EMV-Technik now offers different probe tips to meet the needs of different resolution tests, with 1000 μm, 500 μm, 250 μm and even 150 μm injection probe tip diameters available.
Introduction to Testing:
During testing, the two larger probe tips (500 μm and 1000 μm) are mainly used for attacks on the encapsulated circuitry, while the two smaller probe tips (250 μm and 150 μm) allow very precise localized fault injection into the open circuitry. The figure below shows an example of a chip with a side length of 4 mm and an electromagnetic fault injection into a 4 mm diameter chip using ICI-DP probes with different resolutions, from which it can be seen that the spatial resolution of the small probe tips is significantly improved.
Electromagnetic Fault Injection Tests on 4mm Diameter Chips Using Probes of Different Resolutions
In addition, we also configured a BPS204 fault injection burst power station, the output of the BPS204 is directly connected to the ICI sequence probe to start the test, of course, you need to choose a different resolution of the probe for the test as described above. The test layout is shown in the figure below:
BPS Sequential Burst Power Station for use with ICI Probes
Product Recommendation:
After understanding how to use langer's ICI Sequence Probes for pulse injection, we can choose from the following kits, for details click on the probe kit model to see more information on the technical parameters of the related products.
Dual pulsed magnetic field source probe:
- ICI-DP HH150-15 set , BPS204 burst power station + double pulsed magnetic field source probe (150 µm diameter)
- ICI-DP HH250-15 set BPS204 Sudden Power Station + Dual Pulsed Magnetic Field Source Probe (250 µm Diameter)
- ICI-DP HH500-15 set BPS204 Sudden Power Station + Dual Pulsed Magnetic Field Source Probe (500 µm Diameter)
- ICI-DP HH1000-15 set BPS204 Sudden Power Station + Dual Pulsed Magnetic Field Source Probe (1000 µm Diameter)
Single pulse magnetic field source probe:
- ICI HH500-15 L-EFT set BPS202 Burst Power Station + Pulsed Magnetic Field Source Probe (500 µm Diameter)
- ICI I900 L-EFT set BPS202 Sudden Power Station + Pulsed Current Source Probe
- ICI E450 L-EFT set BPS202 Sudden Power Station + Pulsed Electric Field Source Probe
- ICI 03 L-EFT setThe combination set of the above three sets
Product Features:
- The BPS204 can output high voltages up to 1000 V.
- Magnetic field probe tip diameter down to 250 μm (250 μm, 500 μm, 1000 μm)
- All probe tips are spring loaded
- Dual pulse sequence with variable delay down to 25 ns
- High similarity of two pulses
- All parameters can be controlled via software/API, including pulse polarity
- Pulse rise time approx. 2 ns
- Low trigger-to-pulse delay (~35 ns)
Three different test probe packages:
We offer the following three different test probe packages relative to the size of the chip under test housing (e.g. 4mm in the picture above).
Encapsulation 01:
The tip of the probe in this package is in close proximity to the housing of the probe.
Package 01 design package diagram
Encapsulation 02:
Package 02 provides more maneuverable space both laterally and downwardly relative to package 01.
Package 02 design package diagram
Encapsulation 03:
Tip type 03 is designed for users who need extra space at the bottom. Other customized tip types are available on request. all probe types of the ICI series can also be ordered.
Design Package Diagram for Package 03
