Introduction：

This article mainly summarizes the global IC integrated circuit EMC test standards list and classification summary, including the International Electrotechnical Commission's IEC 62132 immunity test and IEC 61967 emission test sequence standards, as well as China's publication of the YD/T 1690 sequence of telecommunication standards, as well as the recent publication of the new GB/T 42968 sequence of standards, this article will be updated from time to time, the most recent update date The latest update date is November 28, 2024

The International Electrotechnical Commission IEC publishes standards for EMC testing of IC integrated circuits:

The following standards are the number, year, and most recent title of the standard in use and in operation as of the November 28, 2024 search.

IEC 62132 List of immunity EMC test standards for serial integrated circuits:

  • IEC 62132-1:2015 Integrated circuits. Measurement of electromagnetic immunity . Part 1: General conditions and definitions .
  • IEC 62132-2:2010 Integrated circuits. Measurement of electromagnetic immunity. Part 2: Measurement of radiated immunity. TEM cell and broadband TEM cell methods.
  • IEC 62132-4:2006 Integrated circuits. Measurement of electromagnetic immunity from 150 kHz to 1 GHz. Part 4: Direct RF power injection method.
  • IEC 62132-5:2005 "Integrated circuits. measurement of electromagnetic immunity from 150 kHz to 1 GHz. Part 5: Faraday Faraday cage method".
  • IEC 62132-8:2012 Electromagnetic immunity measurement of integrated circuits Part 8: Radiated immunity measurement IC strip line method
  • IEC TS 62132-9:2014 "Integrated circuits. Measurement of electromagnetic immunity. Part 9: Measurement of radiated immunity . Surface scanning method.

IEC 61967 List of emission EMC test standards for serial integrated circuits:

  • IEC 61967-1:2018 RLV Integrated circuits - Measurement of electromagnetic radiation - Part 1: General conditions and definitions
    • Stable version: IEC 61967-1:2018
  • IEC TR 61967-1-1:2015 Integrated circuits - Electromagnetic radiation measurements - Part 1-1: General conditions and definitions - Near-field scanning data exchange format
  • IEC 61967-2:2005 "Integrated circuits - Electromagnetic emission measurements, 150 kHz to 1 GHz - Part 2: Radiated emission measurements - TEM cell and broadband TEM cell methods".
  • IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scanning method
  • IEC 61967-4:2021 RLV "Integrated circuits - Electromagnetic emission measurements - Part 4: Conducted emission measurements - 1-ohm/150-ohm direct coupling method".
    • Stable version: IEC 61967-4:2021
  • IEC 61967-6:2002+AMD1:2008 CSV "Integrated circuits - Electromagnetic emission measurements, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method".
    • Stable version: IEC 61967-6:2002/AMD1:2008
  • IEC 61967-8:2023 RLV "Integrated circuits - Measurement of electromagnetic radiation - Part 8: Measurement of radiated emissions - IC strip line method".
    • Stable version: IEC 61967-8:2023

IEC 62433 List of EMC modeling standards for serial integrated circuits:

  • IEC 62433-1:2019 Modeling of EMC ICs - Part 1: Generic Modeling Framework
  • IEC 62433-2:2017 "EMC IC modeling - Part 2: Integrated circuit models for EMI behavior simulation - Conducted emission modeling (ICEM-CE)".
  • IEC TR 62433-2-1:2010 EMC IC modeling - Part 2-1: Conducted emission black box modeling theory
  • IEC 62433-3:2017 "EMC IC modeling - Part 3: Integrated circuit models for EMI behavior simulation - Radiated emission modeling (ICEM-RE)".
  • IEC 62433-4:2016 "EMC IC modeling - Part 4: Integrated circuit models for RF immunity behavior simulation - Conducted immunity modeling (ICIM-CI)".
  • IEC 62433-6:2020 "EMC IC modeling - Part 6: Integrated circuit models for simulation of impulse immunity behavior - Conducted Impulse Immunity Modeling (ICIM-CPI)".

IEC 62228 List of EMC evaluation criteria for serial integrated circuits - transceiver ICs:

  • IEC 62228-1:2018 Integrated circuits - EMC assessment of transceivers - Part 1: General conditions and definitions
  • IEC 62228-2:2016 "Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers".
  • IEC 62228-3:2019 Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
  • IEC 62228-5:2021 "Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers".
  • IEC 62228-6:2022 "Integrated circuits - EMC evaluation of transceivers - Part 6: PSI5 transceivers".
  • IEC 62228-7:2022 "Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers".

China Communications Industry Standard YD/T 1690 List of EMC test standards for serial IC integrated circuits:

  • YDT 1690.1-2007 Technical Requirements and Measurement Methods for Diagnosis of Internal Electromagnetic Emissions of Telecommunications Equipment (150kHz-1GHz) Part 1-General Conditions and Definitions
  • YDT 1690.2-2007 Technical Requirements and Measurement Methods for Diagnosis of Internal Electromagnetic Emission of Telecommunications Equipment (150kHz-1GHz) Part 2-Radiated Emission Measurement TEM Cell and Broadband TEM Cell Methods
  • YDT 1690.3-2007 Technical Requirements and Measurement Methods for Diagnosis of Internal Electromagnetic Emission of Telecommunication Equipment (150kHz-1GHz) Part 3-Radiated Emission Measurement External Scanning Methods
  • YDT 1690.4-2007 Technical Requirements and Measurement Methods for Diagnosis of Internal Electromagnetic Emission of Telecommunication Equipment (150kHz-1GHz) Part 4-Conducted Emission Measurement 1Ω-150Ω Direct Coupling Methods
  • YDT 1690.5-2007 Technical Requirements and Measurement Methods for Diagnosis of Internal Electromagnetic Emissions of Telecommunications Equipment (150kHz-1GHz) Part 5-Conducted Emission Measurement Faraday Cage Methods
  • YDT 1690.6-2007 Technical Requirements and Measurement Methods for Diagnosis of Electromagnetic Emissions within Telecommunication Equipment (150kHz-1GHz) Part 6-Conducted Emission Measurement Magnetic Field Probe Methods

Chinese National Standards - List of EMC test standards for IC integrated circuits:

  • GB/T 42968.1-2023 Electromagnetic Immunity Measurement of Integrated Circuits Part 1: General Conditions and Definitions
  • GB/T 42968.2-2024 Electromagnetic Immunity Measurement of Integrated Circuits Part 2: Radiated Immunity Measurement TEM Chamber and Broadband TEM Chamber Methods
  • GB/T 42968.8-2023 Electromagnetic Immunity Measurement of Integrated Circuits Part 8: Radiated Immunity Measurement IC Strip Line Method
  • GB/T 43034.2-2024 Measurement of impulse immunity of integrated circuits Part 2: Synchronized transient injection method
  • GB/T 43034.3-2023 Measurement of impulse immunity of integrated circuits Part 3: Asynchronous transient injection method
  • GB/T 44807.1-2024 Publication and Implementation of Standards Electromagnetic Compatibility Modeling of Integrated Circuits Part 1: General Modeling Framework

The following is a list of national standards related to IC emc that have not yet been published:

  • 20214711-T-339 Electromagnetic Immunity Measurement of Integrated Circuits Part 9: Radiated Immunity Measurement Surface Scan Method 20221350-T-339 Electromagnetic Emission Measurement of Integrated Circuits Part 1: General Conditions and Definitions
  • 20214060-T-339 Electromagnetic Immunity Measurement of Integrated Circuits Part 3: High Current Injection (BCI) Method
  • 20214061-T-339 Electromagnetic Immunity Measurement of Integrated Circuits Part 5: Bench Faraday Cage Method
  • 20230227-Z-469 Electromagnetic compatibility test and measurement techniques Part 1: General introduction to immunity testing.
  • 20204839-T-339 Electromagnetic Immunity Measurement of Integrated Circuits Part 4: RF Power Direct Injection Method
  • 20213160-T-339 Integrated Circuit EMC Modeling Part 2: Integrated Circuit Electromagnetic Interference Characterization Simulation Model Conducted Emission Modeling (ICEM-CE)
  • 20213161-T-339 Integrated Circuit EMC Modeling Part 3: Integrated Circuit Electromagnetic Interference Characterization Simulation Model Radiated Emission Modeling (ICEM-RE)
  • 20242335-T-339 Integrated Circuit EMC Modeling Part 4: Simulation Models for RF Immunity Characterization of Integrated Circuits Conducted Immunity Modeling (ICIM-CI)
  • 20242740-T-339 Integrated Circuit EMC Modeling Part 6: Simulation Models for Integrated Circuit Impulse Immunity Characterization Conducted Pulse Immunity Modeling (ICIM-CPI)

Summary:

The above is the list of IC IC EMC test standards of International Electrotechnical Commission (IEC) and our country counted by EUTTEST in November 20124, if you need the full text of the standards, please contact the relevant standards committees to purchase and support the genuine version! '

We only sell IC EMC test systems and equipment that comply with the above standards.

Extended Reading:

EMC test program methodology and test equipment for IC integrated circuits

IC EMC Integrated Circuit EMC Sources of Problems

IC Reactions induced by electromagnetic field coupling of integrated circuit chips

Integrated circuit test equipment