EMC debugging equipment

Introduction: EMC rectification tool is also a test instrument or equipment, its role is to solve the EMI test and EMS test after the product did not pass the test standard requirements, engineers need to modify the circuit schematic alignment, PCB layout diagrams, chip working principle, etc. to rectify and solve the EMC problem, the ultimate goal is to make the object to be measured EUT through the EMC standard requirements of the certification test Limit value.
Our EMC Rectification Tools offer a variety of different rectification kits and equipment based on EMI and EMS test programs, click on a product below or contact us for more information.

The current instrument classification contains the following subcategories:

The current Instruments category and its subcategories contain the following test equipment and products:

Total number of Test Instruments products currently on sale in the Equipment category: 41; Total number of products on current page: 8.
 SX-R 20-1 LANGER-EMV Magnetic Near Field Probe 1GHz-20GHz

 SX-R 20-1 LANGER-EMV Magnetic Near Field Probe 1GHz-20GHz

SX-R 20-1 is a magnetic field probe manufactured by langer-emv and distributed by EUTTEST. It is available in the frequency range of 1GHz to 20GHz and is recommended for use at high frequencies, with a 20GHz...View this product

SX1 SET LANGER-EMV Passive Near Field Probe 1GHz-10(20)GHz

SX1 SET LANGER-EMV Passive Near Field Probe 1GHz-10(20)GHz

The SX1 set is a near-field probe set manufactured by langer-emv and distributed by EUTTEST. The SX1 set consists of two passive near-field probes for high clock frequency measurements in the development phase...View this product

S2 set Pulsed Magnetic Field Monitoring Probe for use with Langer EMV's E1

S2 set Pulsed Magnetic Field Monitoring Probe for use with Langer EMV's E1

S2 set is a pulsed magnetic field monitoring probe manufactured by langer-emv, Germany and distributed by EUTTEST, designed for the correction of products that have failed electrical fast transient pulse train and ESD tests....View this product

RF-U 2.5-2 Magnetic Field Probe Langer EMV 30MHz-3GHz

RF-U 2.5-2 Magnetic Field Probe Langer EMV 30MHz-3GHz

The RF-U Model 2.5-2 Magnetic Field Probe is a near-field probe for detecting RF currents in wires, component pins, SMD assemblies and integrated circuit pins. This probe has an approximately 0.5mm wide magnetic field sensitive notch at the tip, measuring...View this product

RF-R 3-2 Magnetic Field Probe Langer-EMV 30MHz-3GHz

RF-R 3-2 Magnetic Field Probe Langer-EMV 30MHz-3GHz

The RF-R 3-2 near-field probe with high resolution is used for the direct detection of RF magnetic fields on electronic assemblies, such as magnetic fields in pin regions, IC housings, wires, bypass capacitors and electromagnetic compatibility (EMC) components. The magnetic field...View this product

RF-K 7-4 Magnetic Field Probe Langer EMV 30MHz-3GHz

RF-K 7-4 Magnetic Field Probe Langer EMV 30MHz-3GHz

The Model RF-K 7-4 Near Field Probe is capable of measuring annular magnetic field lines that enter the probe in a reverse direction. These magnetic lines are typically found on wires, bar structures, cable splices, edges of flat cells, etc. The probe operates in a manner similar to that of an electric... The probe operates in the manner shown below similar to an electrical...View this product

RF1 set Near-field probe set Langer-EMV 30MHz-3GHz

RF1 set Near-field probe set Langer-EMV 30MHz-3GHz

The RF1 set is a passive near-field probe set manufactured by langer emv in Germany and distributed by EUTTEST.The RF1 near-field probe set consists of 4 passive near-field probes for the measurement of electronic modules in the development phase...View this product

RF-E 10 Magnetic Field Probe Langer EMV 30MHz-3GHz

RF-E 10 Magnetic Field Probe Langer EMV 30MHz-3GHz

The electrodes of the Electric Field Probe Type RF-E 10 are located on the lower side of the probe and are approximately 0.2 mm wide, allowing the smallest sources of electric field to be located, e.g. 0.1 mm wide wires, individual pins of high pin-count integrated circuits. Magnetic Field Probe RF-E 10...View this product