IC-EMC Test Equipment

EMC test instruments for integrated circuits are mainly used to test the radiated emissions on integrated circuits or chips, and can also be used to inject RF interference, pulse voltage and other disturbances through the chip pins or space to confirm whether the chip can still work properly. And electronic products testing EMC, EMC testing of chips is divided into many categories, details click on the product below for more information.

The current instrument classification contains the following instrumentation:

S750 Langer EMV 150Ω High Frequency Current Probe according to IEC 61947-4 
S750 Langer EMV 150Ω High Frequency Current Probe according to IEC 61947-4 

The S750 is a 150 Ω high frequency current probe manufactured by langer-emv and distributed by EUTTEST, available for frequencies from DC to 3 GHz, the S750 complies with IEC 61947-4....

S603 Langer EMV 1Ω High Frequency Current Probe Conforms to IEC 61947-4 
S603 Langer EMV 1Ω High Frequency Current Probe Conforms to IEC 61947-4 

The S603 is a 1Ω high frequency current probe manufactured by Langer EMV and distributed by EUTTEST, available in the frequency range of DC-3GHz, the S603 complies with IEC 61947-4....

P1702 langer integrated circuit electric field probe
P1702 langer integrated circuit electric field probe

The P1702 is an IC-based electric field probe manufactured by langer-emv and distributed by EUTTEST in Germany with a frequency range of up to 3 GHz. The metal housing is compatible with the GND25 connector plate and isolates it from external...

P1602 Langer Magnetic Field Probe EMV DC-3GHz
P1602 Langer Magnetic Field Probe EMV DC-3GHz

The P1602 is a magnetic field test probe for IC integrated circuits manufactured by langer-emv and marketed by EUTTEST, with a frequency range of up to 3 GHz and a metal housing that can be connected to the GND25 connection plate....

P1601 Magnetic Field Probe Langer Integrated Circuit IC Test Magnetic Field Emission
P1601 Magnetic Field Probe Langer Integrated Circuit IC Test Magnetic Field Emission

The P1601 is a magnetic field test probe for IC integrated circuits manufactured by langer-emv and marketed by EUTTEST, with a frequency range of up to 1 GHz and a metal housing that is compatible with the GND25 connection plate....

P750 Langer-EMV 150Ω High Frequency Current Probe Conforms to IEC 61947-4 
P750 Langer-EMV 150Ω High Frequency Current Probe Conforms to IEC 61947-4 

The P750 is a 150Ω high frequency current probe manufactured by langer-emv and distributed by EUTTEST, available for frequencies from 150kHz to 3GHz, the P750 complies with IEC 6194....

P622 Langer EMV 0.1Ω High Frequency Current Probe Conforms to IEC 61947-4 
P622 Langer EMV 0.1Ω High Frequency Current Probe Conforms to IEC 61947-4 

P622 is a 0.1Ω high-frequency current probe manufactured by langer-emv in Germany and distributed by EUTTEST, P622 is an active 0.1Ω probe. The P622 is an active 0.1Ω probe, so it is necessary to provide power from the rear of the probe when testing...

P603-1 Langer-EMV 1Ω High Frequency Current Probe Conforms to IEC 61947-4 
P603-1 Langer-EMV 1Ω High Frequency Current Probe Conforms to IEC 61947-4 

P603-1 is a 1Ω high frequency current probe manufactured by Langer-EMV and distributed by EUTTEST, available from 0.2kHz to 3GHz, P603-1 complies with IEC ...