Integrated circuit test equipment

IC test equipment and other EMC instruments, also divided into interference and anti-interference two parts of the instrument. In addition for integrated circuits IC there are emerging test methods are IC safety test equipment, IC edge channel analysis equipment in these two areas, details click on the product categories below or product links for more information.

The current instrument classification contains the following subcategories:

The current instrument classification contains the following instrumentation:

P603 Langer 1Ω High Frequency Current Probe Conforms to IEC 61947-4 
P603 Langer 1Ω High Frequency Current Probe Conforms to IEC 61947-4 

The P603 is a 1Ω high frequency current probe manufactured by langer-emv and distributed by EUTTEST, available for frequencies from 9kHz to 3GHz, the P603 meets the requirements of IEC 61947-4....

P602 Langer 0.1Ω High Frequency Current Probe Conforms to IEC 61947-4 
P602 Langer 0.1Ω High Frequency Current Probe Conforms to IEC 61947-4 

P602 is a 0.1Ω high-frequency current probe manufactured by langer-emv in Germany and distributed by EUTTEST. P602 is a 0.1Ω probe for direct measurement of high-frequency currents on integrated circuit pins....

EPM02 Langer-EMV Electric Field Probe Option
EPM02 Langer-EMV Electric Field Probe Option

EPM02 is an IC integrated circuit electric field probe manufactured by Langer EMV, Germany and distributed by EUTTTEST. EMP02 is an option that can be used with P1601, P1602, P1...

CS-ESA set and ChipScan-ESA Integrated Circuit IC Test System Software
CS-ESA set and ChipScan-ESA Integrated Circuit IC Test System Software

CS-ESA set is a software package for EMI testing of IC integrated circuits installed on the computer, after the installation of the software named: ChipScan-ESA, IC IC scanning software ChipS...

BPM02 Langer EMV Magnetic Field Probe Option
BPM02 Langer EMV Magnetic Field Probe Option

BPM02 is an IC integrated circuit magnetic field probe manufactured by langer-emv in Germany and distributed by EUTTTEST. BMP02 is an option that can be used with P1601, P1602, P1702...

FLS 106 IC set 4-axis displacement scanning positional test system for integrated circuits
FLS 106 IC set 4-axis displacement scanning positional test system for integrated circuits

FLS 106 IC set is a 4-axis displacement scanning and positioning test system produced by German langer company, which is sold by Shenzhen EUTTEST agent.FLS 106 IC set system contains a...

ICS 105 set 4-axis IC integrated chip Near-field radiation scanner
ICS 105 set 4-axis IC integrated chip Near-field radiation scanner

The ICS 105 set is an IC scanner test system produced by Langer - EMV in Germany and distributed by EUTTEST in Shenzhen, China. The ICS 105 set included in the system can be used for small...

Langer ICR Miniature Near Field Probe for Side Channel Attack Testing of Integrated Circuit Chips
Langer ICR Miniature Near Field Probe for Side Channel Attack Testing of Integrated Circuit Chips

Langer ICR Miniature Near-field Probe Serial is a set of miniature near-field probe for IC chip side channel attack analysis produced by German langer company, which is sold by Shenzhen EUTTEST agent. IC...