The safety test equipment for IC chips mainly uses various test probes to inject fast transient magnetic or electric fields and current pulses into the IC and observe the chip for any anomalies.
Common test methods also include edge channel analysis of the chip, which can also be performed using test instruments of this classification.
The ICS 105 set is an IC scanner test system produced by Langer - EMV in Germany and distributed by EUTTEST in Shenzhen, China. The ICS 105 set included in the system can be used for small...
Langer ICR Miniature Near-field Probe Serial is a set of miniature near-field probe for IC chip side channel attack analysis produced by German langer company, which is sold by Shenzhen EUTTEST agent. IC...
You can search for: study materials, equipment models on the EUTTEST website.
