Introduction：EMI test equipment and system is used in the process of EMC electromagnetic compatibility testing of a kind of instruments and systems, EMI test can detect the EUT itself through the power line, signal line, space and other ways to the outside of the propagation of the interference signal. The EMI test equipment and system provided by our company is to test the interference emitted by the EUT itself from various aspects and angles, in order to reach the limit value requirement of EUT certification standard.
ISN S1 is an impedance matching network for measuring shielded coaxial cables produced by Schwarzbeck in Germany and authorized for sale by EUT TEST in Shenzhen, which can be used to measure telecommunication and data processing equipment...
CAT5 8158 is produced by Germany Schwarzbeck and authorized by Shenzhen EUTTEST agent sales T8-ISN that is, 8-wire impedance matching network, it can test 4 pairs of wires UTP, ...
CAT3 8158 is produced by Germany Schwarzbeck and authorized by Shenzhen EUTTEST agent sales of T8-ISN that is, 8-wire impedance matching network, and the difference between CAT5 8158 and ...
ISN is proposed by the CISPR22 and GB9254 standards, and actually references the AAN parameter requirements of the CISPR16-1-2 standard. The latest reference to AAN is the CISPR32 standard's Table 8: Conducted Emission...
CDNE M3 is a coupling decoupling network produced by Schwarzbeck, Germany and authorized to be sold by EUTTEST in Shenzhen, China.CDNEM3 is mainly used in the latest CISPR15 luminaire test...
CDNE M2 is a coupling and decoupling network produced by Schwarzbeck in Germany and authorized to be distributed by EUTTEST in Shenzhen. Unlike the CDNE M3, the CDNE M2 is only suitable for ...
PA 3010 is a preamplifier produced by Langer EMV in Germany and authorized by EUTTEST in Shenzhen for sale, the test frequency covers 10MHz-10GHz, PA 3010 is used for ...
PA 2522 is a high-frequency low-noise preamplifier produced by LANGER Germany and distributed by EUTTEST Shenzhen, PA 2522 is used to improve the signal-to-noise ratio of near-field probes. For normal use, I...
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