Introduction：
The SX1 set is a near-field probe set manufactured by langer-emv, Germany and distributed by EUTTEST. The SX1 set consists of two passive near-field probes for measuring electric and magnetic fields on electronic modules at high clock frequencies in the R&D phase in the frequency range of 1 GHz to 10 GHz (SX-R 20-1 set Magnetic Field Probe (1 GHz-20 GHz)). ). The probes of the SX1 set probe group can be placed close to the electronic module for measurements, e.g. close to individual IC pins, wires, components and their connections, in order to locate the source of interfering signals. By operating the near-field probes accordingly, the direction and distribution of the electromagnetic field on the electronics module can be measured. These near-field probes are compact and lightweight, and are equipped with skin current attenuation and electrical shielding. The near-field probe can be connected to the 50Ω input of a spectrum analyzer or oscilloscope. The probe has an internal termination resistor.
6GHz Near Field Probe: XF1 set LANGER-EMV Passive Near Field Probe 30MHz-6GHz
6GHz High Resolution: XF1 set Langer-EMV High Resolution Near Field Probe 1MHz-6GHz
40GHz Near Field Probes are now available, please see linked products:HR-E 40-1 set langer-emv magnetic near-field probe 40GHz
SX1 set Packing List.
The following probes are available in any combination, Ø is the approximate resolution that can be tested:
The SX Sequence Near Field Probe consists of multiple probes.
SX1 set Main technical parameters:
Frequency range: 1GHz -10GHz (20GHz)
Interface: SMB, male, jack
SX1 set
- 1GHz-10GHz
- 1x SX-E 03, electric field probe (1GHz-10GHz)
- 1x SX-B 3-1
- 1x SX-R 3-1, Magnetic Field Probe (1GHz-10GHz)
- 1x SMA-SMA 1 m, SMA-SMA measuring cable
- 1x Case 4
SX-R 20-1 set
- 1GHz-20GHz
- 1x SX-R 20-1, Magnetic Field Probe (1GHz-20GHz) SMA
- 1x SMA-SMA 1 m, SMA-SMA measuring cable
- 1x Case 4
Technical data of the included probes
 SX-R 3-1 |
SX-R 3-1, Magnetic field probe (1 GHz-10 GHz)
Ø ≈ 3 mm; resolution = 1 mm |
 SX-R 20-1 |
SX-R 20-1 Magnetic Field Probe (1GHz-20GHz) SMA
Ø ≈ 6*6 mm |
 SX-B 3-1 |
SX-B 3-1, Magnetic Field Probe (1GHz-10GHz)
Ø ≈ 4 mm; resolution = 1 mm |
 SX-E 03 |
SX-E 03, Electric Field Probe (1GHz-10GHz)
Ø ≈ 4*4 mm |
The SX1 set near-field probe test method is shown below:
Near-field probes need to be used with a spectrometer or receiver
SX1 set Near Field Probe Test Methods
Frequency characteristic curves and insertion loss for each probe can be requested by contacting EUTTEST.
Use a low-resolution probe to find the approximate location of the interference, then a high-resolution probe to find the specific component location.