Introduction：
The S2 set is a pulsed magnetic field monitoring probe manufactured by langer-emv in Germany and distributed by EUTTEST, designed for the rectification of products that have failed electrically fast transient pulse bursts and ESD tests.
The S2 set has three different resolution probe fits E1 Anti-jamming Development System or an external EFT pulse train generator is used. The output of the S2 set will be connected to the E1 fiber port for display.
The principle of immunity to disturbance test:
For disturbance immunity problems (Burst/ESD), due to the extreme measurement conditions, it is not possible to measure pulsed currents and pulsed magnetic fields to help identify faults. This is due to the fact that in the case of Burst or ESD interference injection, measurements must be made with field strengths of 100kV/m and pulse rise times of several nanoseconds. Normal measurement techniques, such as oscilloscopes with 50 ohm measurement leads, are not suitable for this. The prerequisite of configuring all probes for high frequency and potential isolation via fiber optics is necessary for extremely small and interference-proof probes without electrical leads. In the magnetic field probes of the S2 set probe concentration, fast transient pulsed magnetic fields and pulsed currents have an extremely disturbing effect on electronic equipment and electronic modules. The purpose of use is to clarify the phenomenon of interference immunity caused by sudden or ESD events. Targeted corrective measures can be determined from the distribution of pulsed currents and pulsed magnetic fields measured by the module or device.
The packing list for the S2 set:
- 1x MSA 02, magnetic field probe (active)
- 1x 05K black, probe for measurement system analysis phase II (MSA 02), (for use with MSA 02, SGZ21)
- 1x 05R white, probe for Measurement System Analysis Phase II (MSA 02), (for use with MSA 02, SGZ21)
- 1x 05U orange, probe for Measurement System Analysis Phase II (MSA 02), (for use with MSA 02, SGZ21)
- 1x MS 101, magnetic field probe for measurement system analysis phase 1 (for use with E1 SGZ21)
- 1x MS 102U, magnetic field probe for measurement system analysis phase I (in conjunction with E1 SGZ21)
- 1x S2 case, System case
- 1x S2 m, S2 Series Operating Instructions
S2 set Actual test chart
Test charts for S2 set and E1 in combination
Illustration of S2 set working with SGZ21 and EFT pulse group generator in E1
In addition, the S2 set is configured with three probes with high resolution, which can directly test a certain chip pin, a certain component pin, and if the data can be tested, it means that the interference must come from this pin location, because its high resolution determines that it will not receive interference from the surrounding components.
High resolution test chart for 05R white