Product Description:
The P603-1 / P750 set from Langer EMV-Technik, Germany, is a set of measurement probes for testing the conducted emissions of integrated circuits and functional chips according to IEC 61967-4. The set contains two different probes, the P603-1 and the P750, and is supplied with the standard CS-ESA test software.
This product is authorized by Shenzhen EUTTEST agent sales and quotation service.
Test function description:
This probe set is used to measure conducted emissions from IC pins according to IEC 61967-4 (direct 1 Ohm/150 Ohm coupling measurements). One probe each is available for current and voltage measurements. The high-resolution probe tips provide access to each test IC pin.
Measurements made with the Probe Kit ensure high precision and comparability for repeat measurements.
Measurements can be performed using the ChipScan-ESA software. The measurement results of all measured pins are saved in the software and can be compared quickly and systematically.
The P603-1 / P750 set includes a list of accessories:
Click on the product model number in the list below for detailed parameters of the accessories in the set.
<<<<提醒：左右滑动表格>>>>| Set Model | P603-1 / P750 set |
| branding | Langer Electronics Langer EMV-Technik |
| agent | EUTTEST |
| Standard configuration list |
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