P1702 langer integrated circuit electric field probe

P1702 langer integrated circuit electric field probe
Manufacturer brand:Langer
Equipment name:IC-EMC Test Equipment

Sales call:134 2515 8926

Sales mailbox:sales@euttest.com

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Introduction:

The P1702 is an IC-based electric field probe manufactured by langer-emv and distributed by EUTTEST, with a frequency range of up to 3 GHz and a metal housing that fits the GND25 connection plate and isolates it from external signal interference.

The role of P1702:

The Model P1702 High Frequency Electric Field Probe is used to measure electric fields emitted from an integrated circuit. These fields are coupled to the electrodes of the probe. The resulting delay current causes a voltage drop at the input of the connected spectrum analyzer. The connected spectrum analyzer measures these voltage drops.

Technical data of the P1702:

Frequency range 0 - 3 GHz
output interface Female N (50 Ω)
Size of the electric field source 42 mm Ø
Frequency characteristic curve of P1702

Frequency characteristic curve of P1702

Diagram of the P1702's composition

Diagram of the P1702's composition

P1702 Test System Configuration Diagram

P1702 Test System Configuration Diagram

As shown in the figure above, the P1702 has an electric field probe mounted on the bottom of the P1702 that senses the electric field on the surface of the IC and displays it on the spectrometer.

P1702 test system to be used with other accessories

P1702 test system to be used with other accessories

The P1702 can be used as a test system with the following products:

P1602 , high-frequency magnetic field probes;

P1702 , high frequency electric field probe;

CS-ESA set , ESA chip scanning software;

EPM 02

BPM 02, dB/dt Field Test System;

D70 h03;

D70 h10 ;

FKE 30;