Introduction：
MFA01 set is a high-resolution miniature near-field probe set produced by langer emv from Germany, which is authorized to be sold and provided with after-sales service by EUTTEST Shenzhen. With its high resolution and excellent performance in magnetic field testing, MFA01 set can precisely locate the magnetic field strength and the location of interference sources radiating outward from the circuit layout, SMD components (0603-0201) and IC pins of integrated circuit chips on PCB boards of electronic circuits.
MFA01 set can pinpoint the location of the test interference source.
All probes included in the MFA01 set are active and electrically shielded. The magnetic field correction factor curves allow the conversion of the 50 Ω voltage output of the probes to the corresponding magnetic field or current in the wire. An additional T-bias type BT 706 is provided to power the preamplifier.
Packing list.
- The MFA01 set includes the following list of products as standard: (if you need a test cable to extend the probe, please contact us to obtain one)
- MFA-R 0.2-6, Miniature Near Field Probe (100MHz-6GHz)
- MFA-K 0.1-12, Miniature Near Field Probe (100MHz-6GHz)
- MFA-R 0.2-75, Miniature Near Field Probe (1MHz-6GHz)
- BT 706, T-Biases
- SMA-SMA 1 m, SMA-SMA measuring cable
- NT FRI EU
- MFA case, System case
- MFA acc
Technical parameters：
Below is a description of the probes included in the MFA01 set, please click on the links to view the technical specifications of each probe.
 MFA-R 0.2-6 |
MFA-R 0.2-6
Miniature near-field probes (100 MHz-6 GHz) The MFA-R 0.2-6 probe has a very small probe tip and can be used to measure high frequency magnetic fields around e.g. IC pins, fine conductors or the smallest packaged SMD devices (0603-0201) on a module.
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 MFA-K 0.1-12 |
MFA-K 0.1-12
Miniature near-field probes (100 MHz-6 GHz) The MFA-K 01-12 probe has a very small probe head, which works on the same principle as a current clamp, and can be used to measure currents on fine conductors or IC pins, capable of shielding field lines acting on the probe from the side.
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 MFA-R 0.2-75 |
MFA-R 0.2-75
Miniature near-field probes (1MHz-6GHz) The MFA-R 0.2-75 probe uses its extremely small probe tip to directly measure high frequency magnetic fields around, for example, IC pins, fine conductors or the smallest packaged SMD devices (0603-0201) on a module.
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 BT 706 |
BT 706
T-Bias
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A diagram of the near-field probe test layout for the MFA 01 SET:
Near-field probes need to be used with a spectrometer or receiver
Near Field Probe Test Layout for MFA 01 SET
Frequency characteristic curves and insertion loss for each probe can be requested by contacting EUTTEST.
Use a low-resolution probe to find the approximate location of the interference, then a high-resolution probe to find the specific component location.
