MFA-R 0.2-75 Near Field Probe Langer EMV 1MHz-1GHz

Introduction：

The MFA-R 0.2-75 probe is manufactured by LANGER EMV in Germany and authorized for sale by EUTTEST in Shenzhen, China, and uses its extremely small probe to directly measure high frequency magnetic fields around e.g. IC pins, fine conductors, or the smallest packaged SMD discrete components (0603 to 0201 range) on a module.MFA-R 0.2-75 Active Magnetic Fields Miniature probe that needs to be connected to the T-bias of the BT 706 for proper operation. The coil opening at the probe is marked laterally with a black dot. This near-field microprobe is small and easy to use. It has a current attenuation sheath and is electrically shielded.

The amplifier is integrated into the top of the probe. The amplifier (9 V, 100 mA) is powered through a T-bias with an impedance of 50 Ω. The near-field microprobe is connected to a spectrum analyzer or oscilloscope with a 50 Ω input through a BT 706 bias T-connector.

With the help of the correction graph below, you can convert the output voltage of the probe's RF interface into the corresponding magnetic field or current flowing through the conductor.

Frequency and current characteristics are plotted below the parameter table so that you can use the conversion factors to convert the RF voltage to the corresponding magnetic field strength or conductor current magnitude.

Technical parameters：

Frequency characteristic curve for MFA-R 0.2-75 [dBµV] / [dBµA/m]

Magnetic Field Correction Curve for MFA-R 0.2-75 [dBµA/m] / [dBµV]

Current Correction Curve for MFA-R 0.2-75 [dBµA] / [dBµV]

Test schematic for MFA-R 0.2-75

Physical test chart for MFA-R 0.2-75