Introduction：
Langer EMV is a German manufacturer of EMC test equipment, the company's full name is Langer EMV-Technik GmbH, the Chinese full name is Langer, Langer is at the forefront of research, development and production in the field of EMC, Langer company through the participation of global EMC exhibitions and EMC seminars to provide customers with a comprehensive Langer provides customers with comprehensive information on test instruments and equipment for near-field electromagnetic field testing and IC test systems by participating in EMC exhibitions and EMC seminars around the world.
Langer's main products include interference emission, immunity EMC measurement technology, IC test systems, and many other solutions, which are mainly used in the development phase and have successful cases and test requirements worldwide.The EMC solutions offered by Langer EMV-Technik GmbH help developers and designers to quickly find solutions to complex EMC problems in IC, device and module development. EMC solutions from Langer EMV-Technik GmbH help developers and designers to quickly find solutions to complex EMC problems in IC, device and module development.
Our company EUTTEST is authorized to act as agent in China to sell all the products of German langer emv company, the detailed list of the products of this company please see the product classification and the table below, the model number of the equipment in the table including set is the abbreviation of the set combination, the set contains the accessories please check the third column of the list of standard configurations. Please click on the model number or contact us to get the technical data file of the relevant product. You can select a model and then contact us for a quotation.
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Anti-jamming rectification tool kit for PCB circuit design
Langer EMV anti-interference rectification and commissioning tool:
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| E1 set | E1 Anti-jamming Development System |
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| S2 set | Magnetic field probe option for E1 |
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| P1 set | Mini Pulse Generator Includes electric and magnetic fields |
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| P23 set | Mini Pulse Electric Field Generator |
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| P11t set | Mini magnetic field pulse generator (B) |
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| P12t set | Mini magnetic field pulse generator (B) |
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Langer EMV Handheld Electric and Magnetic Field Pulse Generator
<<<<提醒：左右滑动表格>>>>
| Equipment Model | Device name | Equipment standard configuration list |
| P1 set | Mini Pulse Generator Includes electric and magnetic fields |
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| P23 set | Mini Pulse Electric Field Generator |
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| P11t set | Mini magnetic field pulse generator (B) |
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| P12t set | Mini magnetic field pulse generator (B) |
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| P23 SET | Mini electric field pulse generator (B) |
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Langer EMV Handheld Electric Fast Transient Pulse Generator
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| H2 set | Handheld Transient EMF Pulse Generator |
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| H3 set | Handheld Transient EMF Pulse Generator |
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| PT4 set | Handheld Transient Pulse Transformers |
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| H4-IC set | Electrically Fast Transient Pulse Swarm Magnetic Field Source Probe |
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| H5-IC set | Electrically Fast Transient Pulse Swarm Magnetic Field Source Probe |
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| BD 11 | Magnetic field transient detector |
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Langer EMV Fiber Optic Link/Optical Transmitter for Analog Signals
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| A100-1 set | Single-channel fiber optic probe (bandwidth 25 KHz) | 1 AE 100, optical receiver 1 AS 100, Optical Sensor (50/ 10) V DC 1 LWL Ø 2.2 mm 1.5 m, 1.5m fiber optic cable 1 NT FRI EU 1 A100-1 acc 1 A100-1 case 1 Analog m, A100-1 Series Operating Instructions |
| A100-2 set | Dual-channel fiber optic probe (bandwidth 25 KHz) | 2 AE 100, Optical Receiver 2 AS 100, Optical Sensor (50/ 10) V DC 2 LWL Ø 2.2 mm 6 m, 6m fiber optics 1 NT FRI EU 1 A100-2 acc 1 A100-2 case, System case 1 Analog m, A100-1 Series Operating Instructions |
| A200-1 set | Single-channel fiber optic probe (bandwidth 500 KHz) | 1 AE 200, optical receiver 1 AS 200, optical sensor (50 / 10) V DC 1 LWL Ø 2.2 mm 1.5 m, 1.5m fiber optic cable 1 NT FRI EU 1 A200-1 acc 1 A200-1 case 1 Analog m, A100-1 Series Operating Instructions |
| A200-2 set | Dual-channel fiber optic probe (500 KHz bandwidth) | 2 AE 200, Optical Receiver 2 AS 200, optical sensor (50 / 10) V DC 2 LWL Ø 2.2 mm 6 m, 6m fiber optics 1 NT FRI EU 1 A200-2 acc 1 A200-2 case, System case 1 Analog m, A100-1 Series Operating Instructions |
| A300-1 set | Single-channel fiber optic probe (bandwidth 5 MHz) | 1 AE 300, optical receiver 1 AS 300, optical sensor analog ± 10 V DC 1 LWL Ø 2.2 mm 1.5 m, 1.5m fiber optic cable 1 NT FRI EU 1 A300-1 acc 1 A300-1 case 1 Analog m, A100-1 Series Operating Instructions |
| A300-2 set | Dual-channel fiber optic probe (5MHz bandwidth) | 2 AE 300, optical receivers 2 AS 300, optical sensor analog ± 10 V DC 2 LWL Ø 2.2 mm 6 m, 6m fiber optics 1 NT FRI EU 1 A300-2 acc 1 A300-2 case, System case 1 Analog m, A100-1 Series Operating Instructions |
Langer EMV Fiber Optic Link/Optical Transmitter for Digital Signals
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| OSE 150-1 set | Single-channel fiber optic probe (transmission rate 50 Mbps) | 1 OE 150, optical receiver 1 S25, Optical Sensor (50 Mbps) 1 LWL Ø 2.2 mm 1.5 m, 1.5m fiber optic cable 1 NT FRI EU 1 OSE 150-1 acc 1 OSE 150-1 case 1 Digital m |
| OSE 150-2 set | Dual-channel fiber optic probe (50 Mbps transmission rate) | 2 OE 150, Optical Receiver 2 S25, optical sensors (50 Mbps) 2 LWL Ø 2.2 mm 6 m, 6m fiber optics 1 NT FRI EU 1 OSE 150-2 acc 1 OSE 150-2 case, System case 1 Digital m |
| OSE 450 set | 4-channel fiber optic probe (50 Mbps transmission rate) SMA | 1 OE 450, optical receiver SMA 4 S25, optical sensors (50 Mbps) 4 LWL Ø 2.2 mm 6 m, 6m fiber optics 1 NT FRI EU 1 OSE 450 case, System case SMA 1 OSE 450 qg, SMA 1 OSE 450 acc, SMA 1 Digital m |
Langer EMV Fiber Optic Link/Optical Transmitter for CAN/LIN Bus Signals
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| OB 100 set | Combination set of CAN 100 SET and LIN 100 set | 2 OB 100 1 CAN 100, fiber optic probe CAN fieldbus 4 Adapter Sockets, 4-poles 1 LIN 100, fiber optic probe 4 Adapter Sockets, 3-poles 1 LWL double 10 m, 10m dual channel fiber optic 1 Wire CuL, copper-plated wire coil 1 NT Ex EU 1 OB 100 set m 1 A4 case |
| CAN 100 set | Dual-channel CAN bus fiber optic link | 2 CAN 100, fiber optic probe CAN fieldbus 1 LWL double 10 m, 10m dual channel fiber optic 1 CAN 100 acc 1 A5 case 1 CAN 100 m |
| LIN 100 set | Dual-channel LIN bus fiber optic link | 2 LIN 100, fiber optic probes 1 LWL double 10 m, 10m dual channel fiber optic 1 LIN 100 acc 1 A5 case 1 LIN 100 m |
Interference Emission Rectification Toolkit for PCB circuit design
Langer EMV Electromagnetic Compatibility Test Tool for Circuit Design Development Stage
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| ESA1 set | Radiation Interference Development System | 1 CS-ESA set, ESA chip scanning software 1 Dongle 1 HFW 21, RF Current Converter 1 HFA 21, RF Leads 1 Z23-1 set, shielded canopy (900x500x400 mm) 1 PA 203 BNC, preamplifier (100KHz-3GHz) 1 RF-B 0.3-3, Miniature Magnetic Field Probe (30MHz-3GHz) 1 RF-B 3-2, magnetic field probe (30 MHz-3 GHz) 1 RF-E 02, electric field probe (30MHz-3GHz) 1 RF-E 05, electric field probe (30MHz-3GHz) 1 RF-E 10, electric field probe (30MHz-3GHz) 1 RF-R 0.3-3, miniature magnetic field probe (30MHz-3GHz) 1 RF-R 3-2, magnetic field probe (30MHz-3GHz) 1 RF-R 50-1, magnetic field probe (30MHz-3GHz) 1 RF-R 400-1, magnetic field probe (30 MHz-3 GHz) 1 RF-U 2.5-2, magnetic field probe (30MHz-3GHz) 1 RF-U 5-2, magnetic field probe (30 MHz-3 GHz) 1 ESA1 acc 1 ESA1 case 1 ESA1 m, operating instructions |
| HFW 21 set | high frequency converter | 1 HFW 21, RF Current Converter 1 HFA 21, RF Leads 1 SMB-BNC 1 m, SMB-BNC measuring cable 1 HFW 21 acc 1 ESA1 m, operating instructions 1 HFW 21 case, System case |
| Z23-1 set | EMC shield (400mm high) | 1 GP 23, Ground floor 1 BZ 23-1, shielding material 1 ZG 23-1, holder |
| Z23-2 set | EMC Shield (650mm high) | 1 GP 23, Ground floor 1 BZ 23-2, shielding material 1 ZG 23-1, holder 1 ZGA 23-2, bracket 2 |
| NNB 21 set | Linear impedance stabilized network | 1 NNB 21, Circuit Network Simulator 1 SMB-BNC 1 m, SMB-BNC measuring cable 1 NNB 21 acc 1 NNB 21 case, System case 1 NNB 21 m, NNB21 Series Operating Instructions |
Langer EMV Radiation Emission Near Field Probe
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| LF1 set | Near-field probe set (100 KHz-50 MHz) | 1 LF-R 400, magnetic field near-field probe (100 KHz - 50 MHz) 1 LF-B 3, magnetic field near-field probe (100KHz-50MHz) 1 LF-U 2.5, magnetic field near-field probe (100 KHz-50 MHz) 1 LF-U 5, magnetic field near-field probe (100 KHz-50 MHz) 1 SMB-BNC 1 m, SMB-BNC measuring cable 1 Case 4+ |
| Passive LF Sequence More Near Field Probes | Magnetic field near-field probes with different test resolutions (100 KHz-50 MHz) | LF-R 400 LF-R 50 LF-R 3 LF-B 3 LF-U 5 LF-U 2.5 LF-K 7 |
| RF1 set | Near-field probe set (30 MHz-3 GHz) | 1 RF-K 7-4, magnetic field near-field probe (30MHz-3GHz) 1 RF-U 2.5-2, magnetic field near-field probe (30 MHz-3 GHz) 1 RF-R 3-2, magnetic field near-field probe (30 MHz-3 GHz) 1 RF-E 10, electric field near-field probe (30 MHz-3 GHz) 1 SMB-BNC 1 m, SMB-BNC measuring cable 1 Case 4 |
| RF2 set | Near-field probe set (30 MHz-3 GHz) | 1 RF-R 400-1, magnetic field near-field probe (30 MHz-3 GHz) 1 RF-R 50-1, magnetic field near-field probe (30 MHz-3 GHz) 1 RF-U 5-2, magnetic field near-field probe (30 MHz-3 GHz) 1 RF-B 3-2, magnetic field near-field probe (30 MHz-3 GHz) 1 SMB-BNC 1 m, SMB-BNC measuring cable 1 Case 4+ |
| RF3 mini set | MINI magnetic near-field probe set | 1 RF-B 0.3-3, Miniature Magnetic Near Field Probe (30MHz-3GHz) 1 RF-R 0.3-3, Miniature Magnetic Near Field Probe (30MHz-3GHz) 1 SMB-BNC 1 m, SMB-BNC measuring cable 1 Case 4 |
| RF4-E set | Electric field near-field probe set | 1 RF-E 02, electric field near-field probe (30 MHz-3 GHz) 1 RF-E 05, electric field near-field probe (30MHz-3GHz) 1 SMB-BNC 1 m, SMB-BNC measuring cable 1 Case 2 |
| RF5 set | RF-R 400-1. RF-R 3-2. RF-U 2.5-2 | |
| Passive RF Sequence More Near Field Probes | EMF near-field probes with different test resolutions (30MHz-3GHz) | RF-R 3-2 RF-U 2.5-2 RF-K 7-4 RF-E 10 RF-R 400-1 RF-R 50-1 RF-U 5-2 RF-B 3-2 RF-B 0.3-3 RF-R 0.3-3 RF-E 02 RF-E 05 RF-E 03 RF-E 04 RF-E 09 RF-B 50-1 RFS-B 3-2 |
| XF1 set | Near-field probe set (30MHz-6GHz) | 1 XF-R 400-1, magnetic field probe (30MHz-6Hz) 1 XF-R 3-1, magnetic field probe (30MHz-6GHz) 1 XF-B 3-1, magnetic field probe (30MHz-6Hz) 1 XF-E 10, electric field probe (30 MHz-6 GHz) 1 XF-U 2.5-1, magnetic field probe (30MHz-6GHz) 1 SMA-SMA 1 m, SMA-SMA measuring cable 1 XF 1 qg, XF1 Series Quick Guide 1 Case 5 |
| Passive XF Sequence More Near Field Probes | EMF near-field probes with different test resolutions (30MHz-6GHz) | XF-R 400-1 XF-R 3-1 XF-B 3-1 XF-U 2.5-1 XF-E 10 XF-R 100-1 XF-E 04s XF-E 09s |
| MFA 01 set | Miniature probe set (1MHz-6GHz) | 1 MFA-R 0.2-6, miniature near-field probe (100MHz-6GHz) 1 MFA-K 0.1-12, miniature near-field probe (100MHz-6GHz) 1 MFA-R 0.2-75, miniature near-field probe (1MHz-6GHz) 1 BT 706, T-Biased 1 SMA-SMA 1 m, SMA-SMA measuring cable 1 NT FRI EU 1 MFA case, System case 1 MFA acc |
| MFA 02 set | Miniature probe set (100MHz-1GHz) | 1 MFA-R 0.2-75, miniature near-field probe (1MHz-6GHz) 1 MFA-K 0.1-30, miniature near-field probe (1MHz-1GHz) 1 BT 706, T-Biased 1 SMA-SMA 1 m, SMA-SMA measuring cable 1 NT FRI EU 1 MFA acc 1 MFA case, System case |
| Passive MFA Sequence More Near Field Probes | Miniature probe set (1MHz-6GHz) | MFA-R 0.2-6 MFA-R 0.2-75 MFA-K 0.1-12 MFA-K 0.1-30 |
| CM-SHP | Magnetic field loop antenna | 1x BNC-SMA Cable 1 |
| SX1 set | Near-field probe sets (1 GHz-10 GHz) | 1 SX-E 03, electric field probe (1 GHz-10 GHz) 1 SX-B 3-1 1 SX-R 3-1, magnetic field probe (1 GHz-10 GHz) 1 SMA-SMA 1 m es, SMA 1 Case 4 |
| SX-R 20-1 set | Magnetic field near-field probes (1 GHz-20 GHz) | 1 SX-R 20-1, Magnetic Field Probe (1GHz-20GHz) SMA 1 SMA-SMA 1 m es, SMA 1 Case 4 |
| Passive SX Sequence More Near Field Probes | EMF near-field probes with different test resolutions (1 GHz-20 GHz) | SX-R 3-1 SX-E 03 SX-B 3-1 SX-R 20-1 |
| Factory Calibration Service | Provide factory calibration report | Suitable for the above LF/RF/XF/RFS sequence near-field probes |
Langer EMV Near Field Probe for Scanning IC Chips on PCBs
The following probes are used for near-field scanning of radiation emission components above an integrated circuit chip on a PCB. Recommended configuration ICS 105 set, 4-axis positioning IC scanner use.
40 GHz high frequency near-field probe
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| HR1 set | IC near-field probe set 40 GHz | 1 HR-R 8-1 1 HR-E 40-1 1 HR SF550S 1 CS-ESA Viewer 1 HR-E char 1 HR-R char 1 HR1 set qg 1 HR-R 8-1 m 1 HR-E 40-1 m 1 A5 case |
| HR-R 8-1 set | Integrated Circuit Magnetic Near-Field Probe Set 40 GHz | 1 x HR-R 8-1, 40 GHz magnetic near-field probe 1 CS-ESA Viewer 1 HR-R char 1 HR-R 8-1 m 1 Case 4 |
| HR-E 40-1 set | Integrated circuit electric field near-field probe set 40 GHz | 1 HR-E 40-1, 40 GHz electric field near-field probe 1 CS-ESA Viewer 1 HR-E char 1 HR-E 40-1 m 1 Case 4 |
Near-field miniature probes
The measuring coils of the following probes are placed vertically in the probe.ICR Near Field Miniature ProbeRequired to work with a positioning system (Langer ICS scanner).
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| ICR HH Sequence | ICR HH Sequential Near Field Mini Probe 0.5MHz-6GHz | ICR HH100-6 set ,2.5MHz-6GHz ICR HH100-27 set ,1.5MHz-6GHz ICR HH150-6 set ,2.5MHz-6GHz ICR HH150-27 set ,1.5MHz-6GHz ICR HH250-6 set ,2.5MHz-6GHz ICR HH250-75 set ,0.5MHz-6GHz ICR HH500-6 set ,2MHz-6GHz ICR HH500-75 set ,200kHz-6GHz |
| ICR HV Sequence | ICR HV Sequential Near-Field Miniature Magnetic Field Probe 200kHz-6GHz | ICR HV100-6 set ,2.5MHz-6GHz ICR HV100-27 set ,1.5MHz-6GHz ICR HV150-6 set ,2.5MHz-6GHz ICR HV150-27 set ,1.5MHz-6GHz ICR HV250-6 set ,2.5MHz-6GHz CR HV250-75 set ,500kHz-6GHz ICR HV500-6 set ,2MHz-6GHz ICR HV500-75 set ,200kHz-1GHz |
| ICR E150 set | Miniature near-field electric field probes 7MHz-3GHz | 1 ICR E150, 7MHz-3GHz) 1 BT 706, T-Biased 1 SMA-SMA RA 1 ICR-C 1 ICR Corr 1 NT FRI EU 1 ICR case1, System case |
| ICR 03 set | The ICR probe will select any combination of three models from the above three probe combinations. | 1 ICR Probe 1 ICR Probe 1 ICR Probe 1 BT 706, T-Biased 1 SMA-SMA RA 3 ICR-C 3xICR Corr 1 NT FRI EU 1 ICR case3 |
IC chip test equipment
Langer EMV Integrated Circuit Test Environment for IEC 61967 Compliance
Introduction to Integrated Circuit EMC Test System
Introduction to IC EMC test items and test equipment
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| ICE1 set | 1 CB 0708, connection plate 1 CB Control, Connection Board Control Software 1 CU 22 1 GND 25, Ground Plate 1 GNDA 01, Ground Adapter 1 GNDA 02, Ground Adapter 1 GNDA 03, grounding adapter 1 GNDA 04, Ground Adapter 1 OA 4005, Oscilloscope Adapter 1 DM-CAM 1 SGA 30, Probe Adapter 1 SGA 45, Probe Adapter 1 TH 22, probe holder 1 PMK ARM 130 1 USB-AB 1 NT FRI EU 1 ICE1 acc 1 ICE case, System case 1 ICE1 m |
Langer EMV Radiated Interference Emission Test Probe for Integrated Circuit Chips
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| P603-1 / P750 set | Conducted emission measurement probes based on IEC 61967-4 standards | 1 x P603-1, 1Ω HF Ammeter SMA 1 x P750, 150Ω high frequency voltmeter 1 CS-ESA, ESA chip scanning software 1 SMA-SMB 1 m, SMA-SMB measuring cable 1 NT FRI EU 1 x P603 / P750 case, System case 1 P603-1 / P750 m, SMA |
| P603 / P750 set | Conducted emission measurements based on the IEC 61967-4 standard | 1 x P603, 1Ω HF Ammeter 1 x P750, 150Ω high frequency voltmeter 1 CS-ESA, ESA chip scanning software 1 SMA-SMB 1 m, SMA-SMB measuring cable 1 x P603 / P750 case, System case 1 P603 / P750 m |
| S603 / S750 set | Conducted emission measurement probes based on IEC 61967-4 standards | 1 x S603, 1Ω HF ammeter SMA 1 x S750, 150Ω HF Voltmeter SMA 1 SMA-SMA 1 m, SMA-SMA measuring cable |
| P1601 / P1702 set | Conducted emission measurement probes based on IEC 61967-4 standards | 1 P1601 1 P1702, high frequency electric field probe 1 CS-ESA set, ESA chip scanning software 1 D70 h03 1 D70 h10 1 SMA-SMA 1 m, SMA-SMA measuring cable 1 SMA-SMB 1 m, SMA-SMB measuring cable 1 N-SMA 1 x P1600 / P1700 case, System case 1 P1600 / P1700 m |
| P1602 / P1702 set | Conducted emission measurement probes based on IEC 61967-4 standards | 1 x P1602, High Frequency Magnetic Field Probe 1 P1702, high frequency electric field probe 1 CS-ESA set, ESA chip scanning software 1 D70 h03 1 D70 h10 1 FKE 30 1 SMA-SMA 1 m, SMA-SMA measuring cable 1 SMA-SMB 1 m, SMA-SMB measuring cable 1 N-SMA 1 x P1600 / P1700 case, System case 1 P1600 / P1700 m |
Langer EMV Radiated Immunity Test Probe for Integrated Circuit Chips
Electrically Fast Transient Pulse Coupling Probe for Integrated Circuits
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| P202 / P302 L-EFT set | Electrically Fast Transient Pulse Coupling Probes | 1 P202 L-EFT, Langer EFT Current Generator (~40V) SMA 1 P302 L-EFT, Langer EFT Voltage generator (~500V) SMA 1 BPS 202, burst source SMA 1 BPS 202-Client, SMA 1 NT Ex EU 1 x P200 / P300 case, System case 1 P202 / P302 m |
| P250 set | Pulse Group Coupling Probe | 1 P250, EFT coupling network 1 TS 250-2.2p 1 TS 250-10p 1 TS 250-1n 1 TS 250-100p 1 TS 250-100n 1 HV FI-FI 1 m, high voltage cable 1 P250 case, System case 1 P250 m |
| P1202-4 / P1302-4 set | Electrically Fast Transient Pulse Groups Field Coupled Probes | 1 P1202-4, EFT/Burst Magnetic Field Source 1 P1202-4 50R, EFT/Burst Magnetic Field Source 1 P1302-4, EFT/Burst Electric Field Source 1 P1302-4 50R, EFT/Burst Electric Field Source 1 D70 h03 1 D70 h10 2 SMA-SMB 1 m, SMA-SMB measuring cable 1 HV FI-SHV 1 m 1 P1202-4 / P1302-4 case, System case 1 P1202-4 / P1302-4 m |
| H4-IC set | Electrically Fast Transient Pulse Swarm Magnetic Field Source Probes | 1 BS 06DB-s, electrically fast transient pulse group IC-magnetic field source 1 HV SHV-SMB 1 m 1 H4-IC case 1 H4-IC m |
| H5-IC set | Electrically Fast Transient Pulse Swarm Magnetic Field Source Probes | 1 BS 06DU-s, electrically fast transient pulse group IC-magnetic field source 1 HV FI-SMB 1 m, SMB high voltage cable 1 H5-IC case 1 H5-IC m |
Electrostatic Discharge Coupling Probes for Integrated Circuits
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| P331-2 set | Electrostatic coupling probe with 330Ω internal resistance | 1 P331-2, ESD Generator 1 BPS 203, burst source 1 BPS 203-Client, Control Software 1 SMA-SMB 1 m, SMA-SMB measuring cable 1 HV FI-FI 1 m, high voltage cable 1 FBK 12P 1m 1 USB-AB 1 NT Ex EU 1 P331 acc 1 P331 case, System case 1 P331 m |
| P331 L-ESD set | Electrostatic coupling probe with 100Ω internal resistance | 1 P331 L-ESD, Langer ESD Generator 1 BPS 203, burst source 1 BPS 203-Client, Control Software 1 SMA-SMB 1 m, SMA-SMB measuring cable 1 HV FI-FI 1 m, high voltage cable 1 FBK 12P 1m 1 USB-AB 1 NT Ex EU 1 P331 case, System case 1 P331 m 1 P331 acc |
| P1202-2 set | Electrostatic field probes | 1 P1202-2, Electrostatic discharge electromagnetic field source 1 BPS 203, burst source 1 BPS 203-Client, Control Software 1 D70 h03 1 D70 h10 2 SMA-SMB 1 m, SMA-SMB measuring cable 1 USB-AB 1 P1202-2 acc 1 NT Ex EU 1 P1202-2 case, System case 1 BPS 203 m 1 P1202-2 m |
| p1202 / p1301 l-esd set | Electrostatic field coupling 200 ps | 1 P1202 L-ESD, Langer ESD Electrostatic Discharge EMF Source 1 P1301 L-ESD, Langer ESD Electrostatic Discharge Electric Field Source 1 BPS 203, burst source 1 BPS 203-Client, Control Software 2 SMA-SMB 1 m, SMA-SMB measuring cable 1 HV FI-FI 1 m, high voltage cable 1 FBK 12P 1m 1 USB-AB 1 D70 h03 1 D70 h10 1 FKE 30 1 NT Ex EU 1 P1202 / P1301 acc 1 x P1202 / P1301 case, System case 1 P1202 / P1301 m |
RF Coupling Probes for Integrated Circuits
Introduction to IC DPI Testing
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| P512 set | IEC62132-4 RF Injection Probes | 1 P512 1 SMA-SMA 1m 18GHz HS 1 NT FRI EU |
| P501 / P503 set | IEC62132-4 RF Injection Probes | 1 P501, DPI coupling network (~3GHz, 50V) 1 P503, DPI coupling network (~1GHz, 50V) 1 SMA-SMA 1 m ds 2 SMA-SMB 1 m ds 1 NT FRI EU 1 P500 case 1 P500 qg 1 P500 m |
| P503 set | IEC62132-4 RF Injection Probes | 1 P503, DPI coupling network (~1GHz, 50V) 1 SMA-SMA 1 m ds 2 SMA-SMB 1 m ds 1 NT FRI EU 1 P500 case 1 P500 m |
| P1401 / P1501 set | IEC62132-4 RF Injection Probes | 1 P1401, high frequency magnetic field source (~1 GHz) 1 P1501, HF electric field source (~1GHz) 1 D70 h03 1 D70 h10 2 SMA-SMB 1 m, SMA-SMB measuring cable 1 x P1401 / P1501 case, System case 1 P1400 / P1500 m |
| P1402 / P1502 set | IEC62132-4 RF Injection Probes | 1 P1402, high-frequency magnetic field source (~3 GHz) 1 P1502, HF electric field source (~3 GHz) 1 D70 h03 1 D70 h10 2 SMA-SMB 1 m, SMA-SMB measuring cable 1 FKE 30 1 x P1402 / P1502 case, System case 1 P1400 / P1500 m |
Security Test Probes for EMFI and Edge Channel Analysis of Integrated Circuits
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| ICI-DP HH250-15 set | Fault Injection Probe | 1 ICI-DP HH250-15 1 BPS 204 1 BPS 204-Client 1 HV FI-FI mini 1 m, high voltage cable 1 SK FI-FI 7P 1 m 4xSMA-SSMB 1 m 1 NT FRI EU 24V 1 USB-AB 1 ICI-DP case 1 ICI-DP m 1 BPS 204 m |
| ICI-DP HH500-15 set | Fault Injection Probe | 1 ICI-DP HH500-15 1 BPS 204 1 BPS 204-Client 1 HV FI-FI mini 1 m, high voltage cable 1 SK FI-FI 7P 1 m 4xSMA-SSMB 1 m 1 NT FRI EU 24V 1 USB-AB 1 ICI-DP case 1 ICI-DP m 1 BPS 204 m |
| ICI-DP HH1000-15 set | Fault Injection Probe | 1 ICI-DP HH1000-15 1 BPS 204 1 BPS 204-Client 1 HV FI-FI mini 1 m, high voltage cable 1 SK FI-FI 7P 1 m 4xSMA-SSMB 1 m 1 NT FRI EU 24V 1 USB-AB 1 ICI-DP case 1 ICI-DP m 1 BPS 204 m |
| ICI HH500-15 L-EFT set | Pulsed Magnetic Field Source Probes | 1 ICI HH500-15 L-EFT, Pulsed Magnetic Field Source 1 BPS 202, burst source SMA 1 BPS 202-Client, SMA 1 NT Ex EU 1 ICI 01 L-EFT acc 1 ICI case 1 ICI m |
| ICI I900 L-EFT set | Pulsed current injection probes | 1 ICI I900 L-EFT, Pulse Current Source (FBBI) 1 BPS 202, burst source SMA 1 BPS 202-Client, SMA 1 NT Ex EU 1 ICI 01 L-EFT acc 1 ICI case 1 ICI m |
| ICI E450 L-EFT set SMA | Fault Injection Probe | 1 ICI E450 L-EFT, Pulse E-Field Source 1 BPS 202, burst source SMA 1 BPS 202-Client, SMA 1 NT Ex EU 1 ICI 01 L-EFT acc 1 ICI case 1 ICI m |
| ICI 03 L-EFT set | EMP Coupling Probe | 1 ICI HH500-15 L-EFT, Pulsed Magnetic Field Source 1 ICI E450 L-EFT, Pulse E-Field Source 1 ICI I900 L-EFT, Pulse Current Source (FBBI) 1 BPS 202, sudden power station SMA 1 BPS 202-Client, SMA 1 NT Ex EU 1 ICI 01 L-EFT acc 1 ICI case 1 ICI m |
Near-field probe positioning system
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| ICS 105 set | 4-Axis IC Positioning Scanner | 1 ICS 105 1 CS-Scanner, ChipScan-Scanner software 1 GND 25, Ground Plate 1 DM-CAM 1 ICS Flight case 1 ICS 105 m |
| FLS 106 IC set | 4-Axis IC Positioning Scanner Larger test area | 1 FLS 106 IC 1 CS-Scanner, ChipScan-Scanner software 1 GND 25, Ground Plate 1 DM-CAM 1 Rotary unit 1 DM-CAM holder.3, SMA 1 FLS 106 IC acc |
| FLS 106 PCB set | PCB Scanner (3-axis positioning system) | 1 FLS 106 PCB 1 CS-Scanner, ChipScan-Scanner software 1 UH DUT set 1 SH 01 1 DM-CAM 1 FLS 106 PCB acc 1 FLS 106 m |
Near Field Probe for Langer-EMV Scanners
<<<<提醒：左右滑动表格>>>>| Equipment Model | Device name | Equipment standard configuration list |
| LFS-B 3 | Magnetic field probes | LFS-B 3, Magnetic Field Probe (100KHz-50MHz) |
| RFS set | scanning probe | 1 RFS-B 3-2, scanning probe (30MHz-3GHz) 1 RFS-E 03, scanning probe (30MHz-3GHz) 1 RFS-R 50, scanning probe (30MHz - 3GHz) 1 SMA-SMA 1 m, SMA-SMA measuring cable 1 RFS case, System case |
| Other optional probes | Passive Probes Contains RFS sequences and XFS sequences | Cal service LF/RF/XF/RFS RFS-R 0.3-3 RFS-B 0.3-3 RFS-R 3-2 RFS-E 01 RFS-E 02 RFS-E 05 RFS-E 10 XFS-R 3-1 XFS-B 3-1 XFS-E 09s, SMA XFS-E 10 Ext 145, SMA SMA Ext 200 Ext 300, SMA SMA |
Summary:
The above are all the products that LANGER EMV is still producing and selling in the middle of 2024. As the agent of LANGER EMV in China, we provide quotation and after-sale installation and training service for all the products. Please click the first column product model or contact us to get more related product information.
