Introduction：
ICI 03 L-EFT set is a set of Langer - EMV Germany produced by the configuration of the electric field, magnetic field, current pulse three different probes of the test system combination set, the test system is designed to test the immunity of the IC chip samples and the detection of fault injection tolerance. Three kinds of injection by three different injection probe to complete, the same three probes all support IC simulation attack test analysis and body bias injection, also allows the measurement channel analysis test the safety critical circuitry of the chip under test, the three probes support high-resolution test position and pulse jitter test, interrupt test in some specific program location points. Detailed parameters for each probe are available by clicking on the links in the list below or by contacting us for information.
Accessories included in the test system:
- ICI HH 500-15 L-EFT Pulsed Magnetic Field Injection Probes
- ICI E450 L-EFT Pulsed electric field injection probes
- ICI I900 L-EFT Pulsed Current Injection Probe (FBBI)
- BPS 202 Pulse Signal Source
- BPS 202 client Pulse output control test software
- NT Ex EU, Power Adapter
- ICI 01 L-EFT Acc, test cables and other accessories
- ICI case
- ICI m , instructions for use
ICI 03 L-EFT set Test System Configuration Diagram - Pulsed Magnetic Field Injection
