Introduction：
FLS 106 IC set is a 4-axis displacement scanning and localization test system produced by German langer company, which is sold by Shenzhen EUTTEST agent. FLS 106 IC set system includes a model FLS 106 IC displacement test system and IC scanner, which is controlled by the standard chipscan-scanner software. Chip test engineers can place the chip under test on the test plate UH DUT, and the host computer moves up to 10GHz test probes to test the magnetic and electric fields above the chip under test.
FLS 106 IC set supplied test plate UH DUT
The probe will be moved by the scanner host along the XYZ three axes linearly and allowed to rotate 180 ° test at a certain coordinate, truly no dead angle chip EMC test evaluation.
FLS 106 IC set can move linearly along the XYZ axes
The standard DM-CAM micro-camera is used to observe the chip under test in real time, preventing damage to the chip by movement of the machine setup.
DM-CAM Miniature Camera
function：
The chip under test can be tested directly using the standard GND 25;
Full-board EMC scan can be performed by directly placing the PCB loaded with the chip under test.
Place the PCB loaded with the chip under test for a full board EMC scan.
Technical parameters：
| Test Kit Model | FLS 106 IC set |
| producers | Langer emv |
| agent | Shenzhen EUTTEST |
| Supply Voltage | 110V or 220V |
| PC interface | USB |
| Maximum travel range | 400mm*600mm*120mm,±180° |
| Minimum step size | 20μm*20μm*20μm, 1° |
| Probe displacement speed | (20*25*10) mm/s, 90°/s |
| operating temperature | 10°C-30°C |
| work in moderation | Max 85% |
| weight | 75kg |
| size | 1030mm*775mm*900mm |
| Standard accessories | FLS 106 IC , 4-axis integrated circuit tester CS-Scanner, ChipScan-Scanner Test Software GND 25, grounding plate according to IEC 61967 DM-CAM, Miniature Magnifying Camera Rotary unit, probe holder DM-CAM holder.3 , Camera Stands FLS 106 IC acc , cables and other accessories Training by euttest Training External NA5 EMERGENCY STOP Switch , Emergency Stop Switches |
| Optional Accessories | SH 01 Probe Holder UH DUT set Test Plate |
Complete FLS 106 IC set Test System Measured Diagram
The FLS 106 IC set can be paired with test probes and spectrometers:
FLS 106 IC set is just a displacement system for moving test probes to scan test chip EMC, test engineers also need to configure probes and spectrum analyzers with different frequencies and resolutions to complete the test. Below are the models of probes and spectrum analyzers that we suggest to configure:
Probe:
- ICR Miniature Near Field Probe
- ICI 01 L-EFT set IC EMP injection probe
- Langer XF Sequential Near Field Probe 30MHz-6GHz
- SX1 set, near-field probe set 1GHz-10GHz
- PA 306 SMA , Low Noise Preamplifier 100kHz-6GHz
- More available near-field probes
spectrograph
- R&S FSV
- R&S FSW
- R&S FSVA3000
- R&S FSV3000
- R&S FPS
- R&S FSVR
- R&S FPL1000
- R&S FPC
- R&S FSC
- R&S FSH