FLS 106 IC set 4-axis displacement scanning positional test system for integrated circuits

Model: FLS 106 IC set
Brand: Langer-EMV

Min. order: 1 unit
Stock: 0
Delivery: 1-16 weeks

Standards: /
Industry: /

Warranty: Original Import ; New Products ; Authorized Sales
Training: On-site training; Telephone; Email
Logistics: Shenzhen to National
Payment: Online banking

Product Price:

Introduction:

FLS 106 IC set is a 4-axis displacement scanning and localization test system produced by German langer company, which is sold by Shenzhen EUTTEST agent. FLS 106 IC set system includes a model FLS 106 IC displacement test system and IC scanner, which is controlled by the standard chipscan-scanner software. Chip test engineers can place the chip under test on the test plate UH DUT, and the host computer moves up to 10GHz test probes to test the magnetic and electric fields above the chip under test.

FLS 106 IC set supplied test plate UH DUT

FLS 106 IC set supplied test plate UH DUT

The probe will be moved by the scanner host along the XYZ three axes linearly and allowed to rotate 180 ° test at a certain coordinate, truly no dead angle chip EMC test evaluation.

FLS 106 IC set can move linearly along the XYZ axes

FLS 106 IC set can move linearly along the XYZ axes

The standard DM-CAM micro-camera is used to observe the chip under test in real time, preventing damage to the chip by movement of the machine setup.

DM-CAM Miniature Camera

DM-CAM Miniature Camera

function:

The chip under test can be tested directly using the standard GND 25;

Full-board EMC scan can be performed by directly placing the PCB loaded with the chip under test.

Place the PCB loaded with the chip under test for a full board EMC scan.

Place the PCB loaded with the chip under test for a full board EMC scan.

Technical parameters:

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Test Kit ModelFLS 106 IC set
producersLanger emv
agentShenzhen EUTTEST
Supply Voltage110V or 220V
PC interfaceUSB
Maximum travel range400mm*600mm*120mm,±180°
Minimum step size20μm*20μm*20μm, 1°
Probe displacement speed(20*25*10) mm/s, 90°/s
operating temperature10°C-30°C
work in moderationMax 85%
weight75kg
size1030mm*775mm*900mm
Standard accessoriesFLS 106 IC , 4-axis integrated circuit tester

CS-Scanner, ChipScan-Scanner Test Software

GND 25, grounding plate according to IEC 61967

DM-CAM, Miniature Magnifying Camera

Rotary unit, probe holder

DM-CAM holder.3 , Camera Stands

FLS 106 IC acc , cables and other accessories

Training by euttest Training

External NA5 EMERGENCY STOP Switch , Emergency Stop Switches

Optional AccessoriesSH 01 Probe Holder

UH DUT set Test Plate

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Complete FLS 106 IC set Test System Measured Diagram

Complete FLS 106 IC set Test System Measured Diagram

The FLS 106 IC set can be paired with test probes and spectrometers:

FLS 106 IC set is just a displacement system for moving test probes to scan test chip EMC, test engineers also need to configure probes and spectrum analyzers with different frequencies and resolutions to complete the test. Below are the models of probes and spectrum analyzers that we suggest to configure:

Probe:

  • ICR Miniature Near Field Probe
  • ICI 01 L-EFT set IC EMP injection probe
  • Langer XF Sequential Near Field Probe 30MHz-6GHz
  • SX1 set, near-field probe set 1GHz-10GHz
  • PA 306 SMA , Low Noise Preamplifier 100kHz-6GHz
  • More available near-field probes

spectrograph

  • R&S FSV
  • R&S FSW
  • R&S FSVA3000
  • R&S FSV3000
  • R&S FPS
  • R&S FSVR
  • R&S FPL1000
  • R&S FPC
  • R&S FSC
  • R&S FSH

 

Service

Our company sells all the instrumentation equipment products provide after-sales personnel door-to-door training or telephone, e-mail, microblogging and other ways of installation and training services.

We are committed to supplying equipment that is brand new and manufactured by the original manufacturers at home and abroad.

After-sales of the product is carried out by the after-sales policy provided by the original equipment manufacturer.

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Sales call:134 2515 8926

Sales mailbox:sales@euttest.com

Company Wechat: euttest

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