Introduction：
FCC-TEM-JM4 is produced by the U.S. FCC and authorized by the Shenzhen EUTTEST agent sales of TEM transverse electromagnetic wave chamber, can be used in the DC-2500MHz small-size PCB or integrated circuit chip EMI-RE radiated emissions and EMS-RS radiated immunity test, which has a patented design of the diaphragm to provide a wide frequency response, excellent field uniformity, low VSWR and low insertion loss.
The JM4 and FCC-TEM-JM2 models are ideal for radiated emission testing of semiconductor devices according to SAE 1752/3. The JM series of TEM cells can be used for immunity testing and require only 3.7 mW of input power to achieve a 10 V/m field, and 37 W of input power to achieve a 1000 V/m field.
EUTTEST also offers a full line of US FCC current probes, click the link below for more information.
U.S. FCC Current Probes / Injection Probes / Calibration Fixtures
Technical parameters：
<<<<提醒：左右滑动表格>>>>| Product model | FCC-TEM-JM4 |
| manufacturer | U.S. FCC |
| agent | Shenzhen EUTTEST |
| Available frequency | DC-2500MHz |
| Maximum measurable EUT size | 6*6*1 cm |
| Maximum input power | 500W |
| connector | N |
| VSWR | 1.2:1 |
| External dimensions | 15*10*34cm |
| Meet the standard | SAE 1752/3 |
More optional TEM models:
- FCC-TEM-JM1 Transverse Electromagnetic Wave TEM Chamber DC-1200MHz
- FCC-TEM-JM2 Transverse Electromagnetic Wave TEM Chamber DC-1600MHz
- FCC-TEM-JM3 Transverse Electromagnetic Wave TEM Chamber DC-2000MHz
- FCC-TEM-JM5 Transverse Electromagnetic Wave TEM Chamber DC-3000MHz
- EM601-6 Transverse Electromagnetic Wave TEM Chamber DC-6GHz
