Introduction：
FCC-TEM-JM2 is produced by the U.S. FCC and authorized by the Shenzhen EUTTEST agent sales of TEM transverse electromagnetic wave chamber, JM2 and JM1 can be used in the PCB or IC EMI-RE radiated emissions and EMS-RS radiated immunity test, which has a patented diaphragm design to provide a wide frequency response, excellent field uniformity, low VSWR and low insertion loss.
The FCC-TEM-JM1 and JM2 models are ideal for radiated emission testing of IC semiconductor devices according to SAE 1752/3. They require only 3.7 mW input power to achieve 10 V/m field for immunity testing and 37 W input power to achieve 1000 V/m field.
EUTTEST also offers a full line of US FCC current probes, click the link below for more information.
U.S. FCC Current Probes / Injection Probes / Calibration Fixtures
Technical parameters：
<<<<提醒：左右滑动表格>>>>| Product model | FCC-TEM-JM2 |
| manufacturer | U.S. FCC |
| agent | Shenzhen EUTTEST |
| Available frequency | DC-1600MHz |
| EUT Port Size | 9.1*9.1cm |
| Maximum measurable EUT size | 6*6*1 cm |
| Maximum input power | 500W |
| External dimensions | 15*10*34cm |
| connector | N |
| VSWR | 1.2:1 |
| Meet the standard | SAE 1752/3 |
More optional TEM models:
- FCC-TEM-JM1 Transverse Electromagnetic Wave TEM Chamber DC-1200MHz
- FCC-TEM-JM3 Transverse Electromagnetic Wave TEM Chamber DC-2000MHz
- FCC-TEM-JM4 Transverse Electromagnetic Wave TEM Chamber DC-2500MHz
- FCC-TEM-JM5 Transverse Electromagnetic Wave TEM Chamber DC-3000MHz
- EM601-6 Transverse Electromagnetic Wave TEM Chamber DC-6GHz
