FCC-TEM-JM2 Introduction:
FCC-TEM-JM2 is produced by the U.S. FCC and authorized by the Shenzhen EUTTEST agent sales of TEM transverse electromagnetic wave chamber, FCC-TEM-JM2 and JM1 can be used in the PCB or IC EMI-RE radiated emissions and EMS-RS radiated immunity test, which has a patented design of the diaphragm to provide a wide frequency response, excellent field uniformity, low VSWR and low insertion loss.
The FCC-TEM-JM1 and FCC-TEM-JM2 models are ideal for radiated emission testing of IC semiconductor devices according to SAE 1752/3. Only 3.7 mW input power is required to achieve 10 V/m field for immunity testing, and 37 W input power can achieve 1000 V/m field.
EUTTEST also offers a full line of US FCC current probes, click the link below for more information.
U.S. FCC Current Probes / Injection Probes / Calibration Fixtures
Technical specifications of FCC-TEM-JM2:
Available frequency | DC-1600MHz |
EUT Port Size | 9.1*9.1cm |
Maximum measurable EUT size | 6*6*1 cm |
Maximum Input Power | 500W |
External dimensions | 15*10*34cm |
connector | N |
VSWR | 1.2:1 |
Meet the standard | SAE 1752/3 |
More optional TEM models:
FCC-TEM-JM1 Transverse Electromagnetic Wave TEM Chamber DC-1200MHz
FCC-TEM-JM2 Transverse Electromagnetic Wave TEM Chamber DC-1600MHz
FCC-TEM-JM3 Transverse Electromagnetic Wave TEM Chamber DC-2000MHz
FCC-TEM-JM4 Transverse Electromagnetic Wave TEM Chamber DC-2500MHz
FCC-TEM-JM5 Transverse Electromagnetic Wave TEM Chamber DC-3000MHz
EM601-6 Transverse Electromagnetic Wave TEM Chamber DC-6GHz