Principle of EM601-6:
EM601-6 is produced by the United States ESDEMC and authorized by EUTTEST agent sales of TEM-cell transverse electromagnetic wave chamber, can be used for IC integrated circuits standard IEC61967-2 and IEC62132-8 TEM test method and strip line test method, EM601-6 can be used for testing up to 6GHz, the radiated field strength of up to 80 V/m @ 1V (static field maximum 240 kv/m transient field maximum 400 kv/m). 1V (static field up to 240 kv/m, transient field up to 400 kv/m).
What is a TEM-cell?
"TEM" stands for "transverse electromagnetic (mode)". A transverse mode of electromagnetic radiation is a specific field pattern radiated in a plane perpendicular to (i.e., transverse to) the direction of propagation of the radiation.The TEM unit is a rectangular coaxial transmission line that tapers at each end to form a geometry specifically designed to create a TEM mode over a given frequency range (typically DC to several hundred MHz).
The useful frequency range of a TEM cell is determined by its geometry, but generally follows the rule that the larger the TEM, the lower the upper frequency range available. Above a certain cutoff frequency, higher order modes are created (as shown below), which can make all test volumes unstable throughout the test volume. Perhaps the easiest way to explain the TEM is through what it does: the TEM allows you to measure the radiated field strength of a product and subject the product to a given field strength. Learn more about the TEM and contact EUTTEST for more information.
For more information about TEM-cell, please refer to the following article:
TEM-cell Test Guide for Radiated Emissions and Radiated Immunity
EM601-6 can meet the standard:
- Electromagnetic Immunity Testing of ICs
- Electromagnetic Radiation Testing of ICs
- ESD field sensitivity testing of ICs
- IEC 61967-2:2005 Integrated circuits - Measurement of electromagnetic radiation from 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and broadband TEM cell method
- IEC 61967-8:2011 Integrated circuits - Measurement of electromagnetic radiation from 150 kHz to 3 GHz - Part 8: Measurement of radiated emissions - IC strip line method
- IEC 62132-8:2012 Integrated circuits - Electromagnetic immunity measurements, 150 kHz to 3 GHz - Part 8: Radiated immunity measurements - IC stripline methods
- SAE 1752-3 Measurement of Radiated Emissions from Integrated Circuits - TEM / Broadband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Broadband TEM Cell (150 kHz to 8 GHz)
EM601-6 Technical Data:
<<<<提醒：左右滑动表格>>>>| Frequency range | DC - 6 GHz (first peak frequency of high sub-mode > 6 GHz) |
| Product Principle | TEM-cell Transverse Electromagnetic Wave Chamber |
| TEM Cell Impedance | 50Ω ± 5% |
| VSWR | DC- 3 GHz <1.1 3 - 5.5 GHz <1.5 5.5 - 6 GHz <1.9 |
| Insertion loss (S21) | DC- 3 GHz <1 dB 3 - 6 GHz <1.5 dB |
| Return loss (S11 & S22) | DC- 3 GHz >25 dB 3 - 5.5 GHz >14 dB 5.5 - 6 GHz >10 dB |
| Effective chamber height | 12.5 mm |
| Electric field strength at the center of the cell | 80 V/m @ 1V (static field max. 240 kv/m, transient field max. 400 kv/m) The input power for a 10 V/m field is only 0.3125 mW, and for a 1000 V/m field it is only 3.125 W. This value is based on the premise that the height of the bulkhead-chamber wall is 12.5 mm. |
| Magnetic field strength at the center of the chamber | = Electric field strength /377 (A/m) |
| agent | Euttest |
| RF connector | N-shape |
| Maximum input power | 500 watts |
| Maximum Input Voltage | 3 kV @DC, 5kV @Pulse |
| DUT Port Size | 50 (W) x 50 (D) mm |
| Recommended maximum DUT size | 30 (W) x 30(W) x 3(H) mm |
| TEM chamber size | 170 (W) x 120 (D) x 70 (H) mm; 6.5 (W) x 4.5 (D) x 1 in. |
| weight | Approx. 1 kg; 2 lbs. |
The EM601-6 is used in a wide range of applications:
ESDEMC's EM601-6 is a DC-6GHz Transverse Electromagnetic Wave TEM Cell, which can generate a uniform and controllable electromagnetic field in the cavity of the cell after inputting an RF signal at the input end, to perform immunity testing of eut module under test or IC. IC or other modules are mounted on the test fixture and placed in the cell, and an EMI receiver can also be used to test the RE characteristics of the IC or module. The EM601-6 works on the same principle as the TEM Cell. The E/H field inside the test chamber is proportional to the input voltage and inversely proportional to the height of the cell. Due to the wide operating band of this device, it can be applied in many fields such as EMI, EMS, receiver sensitivity testing and so on.
