E1 set Anti-jamming Development System LANGER EMV ESD EFT Retrofit Kit

Introduction：

The E1 set Immunity Development Systems, produced by LANGER EMV and marketed by EUTTEST, are EMC tool systems for EMS immunity analysis during PCB development of integrated circuit boards.

Adopting the E1 SET anti-jamming development system, it can quickly and preciselyRectification of localized pulse group interferencerespond in singingelectrostatic dischargeThe E1 SET enables engineers and developers to accurately design appropriate EMC measures to address the causes of interference (weak points) and to evaluate the effectiveness of EMC measures using the E1 SET. The E1 SET test equipment can be set up in a small space, making it suitable for use in the workplace of electronic component developers.

The E1 SET Chinese User's Manual from EUTTEST and langer-emv describes in detail the mechanism of EMC operation and the basic measurement strategy for de-interference of integrated circuit boards. The E1 SET package includes a swarm and ESD generator, nine different electric and magnetic field sources, and a variety of other accessories.

Product Features:

The anti-interference design of the product comes from the enterprise's pursuit of product quality, but also the requirements of electromagnetic compatibility testing standards. Due to the transient interference with fast and wide spectrum and other characteristics, the traditional oscilloscope and spectrum analyzer and other means, are unable to accurately measure the transient electromagnetic field. The anti-interference design of the product can only be considered in the final test phase of the product, the means adopted is shielding or filtering, isolation of the external interference or directly lead to the grounding system.

LANGER's E1 anti-interference development system uses special measurement methods without interferences and an original pulse rate test method to eliminate electromagnetic sensitivity problems at the design stage, improve the quality of the product design, and enhance the stability and reliability of the product.

In the EMC test requirements, the following test items are sudden interference test items:

• IEC61000-4-4 (National standard GB/T-17626.4): Electrical fast transient pulse group immunity test
• IEC61000-4-2 (National standard GB/T-17626.2): Electrostatic discharge immunity test
• GJB151A/152A-CS115: Cable bundle injection pulse excitation conduction sensitivity
• GJB151A/152A-RS105: Radiation sensitivity to transient electromagnetic fields

E1 set Anti-jamming rectification test principle:

E1 set anti-jamming development system can be applied to the measured object sudden interference, reproduce the phenomenon of failure of the measured object; can be used in different ways, the electronic module directly injected into the sudden electric field interference or magnetic field interference, so as to locate the electromagnetic weak points on the circuit board, understand the coupling mechanism, and complete the most optimal design modifications.

Functionally, LANGER anti-interference development system consists of signal source, field source probe set, transient magnetic field probe set, fiber optic input counter, EMC sensors, etc. All parts cooperate with each other to achieve rapid positioning of electromagnetic sensitive points:

The SGZ 21 signal source, with isolated output, generates continuous EFT or ESD-like interference pulses with a rising edge time of 2 ns and a falling edge time of about 10 ns. These pulses contain less energy than 2/50 ns EFT [according to EN61000-4-4] or ESD [according to EN61000-4-2] pulses and can therefore be coupled directly into electronic modules without damaging the equipment under test. Smaller, so it can couple the interference directly into the electronic module without damaging the device under test, determine whether it is magnetic field sensitive or electric field sensitive, and then use the transient magnetic field probe to measure the strength of the magnetic burst field and analyze the path of the interference current.

Field Source Probe Sets, including magnetic field field source probes and electric field field source probes in various sizes and shapes, with a minimum resolution of less than 1 mm, can be connected to the SGZ 21 signal source to inject interference into the grounding system, power supply system, integrated circuits, pins, discrete components, critical wiring, cables, plugs, etc. in the circuit under test and used to accurately locate the position of sensitive points in the circuit.

A variety of EMC sensors are used to monitor the interference of critical signal lines, power, ground, cables, connectors, etc. on the PCB.

The SGZ 21 outputs a pulse signal with a continuously varying pulse amplitude, with peaks between 0 and 1500 V, distributed according to statistical averaging. A counter with fiber optic (2.2 mm plastic fiber) input is built into the generator. Using the special signals from the counter and the source, together with sensors and transient magnetic field probes, LANGER has developed an original pulse rate test method, with which it is possible to carry out a quick assessment of the immunity of circuit modules, as well as to quickly assess the effectiveness of circuit modifications, shielding and filtering, thus saving a great deal of development time.

E1 set Packing list for anti-jamming development system:

The E1 set Immunity Development System includes the following accessories as standard:

E1 set List of standard equipment for anti-jamming development systems

• SGZ 21, Pulse Group Generator - Pulse Density Counter
• S21, optical sensor (10Mbps)
• BS 02
• BS 04DB, Magnetic Field Source Probes
• BS 05D, magnetic field source
• BS 05DU, Magnetic field source probe
• ES 00, electric field source probe
• ES 01, Electric Field Source Probe
• ES 02, Electric Field Source Probe
• ES 05D, Electric Field Source Probe
• ES 08D, Electric Field Source Probes
• MS 02, Magnetic field probe
• E1 acc
• NT FRI EU
• E1 case, Systemcase
• E1m,E1 Series User's Manual

E1 anti-jamming basic development equipment, including SGZ 21 signal source [counter with built-in fiber optic input], S31 sensor, MS02 passive transient magnetic field probe, and a set of magnetic field field source probes and electric field field source probes.

2.1 SGZ 21 Signal Generator

The SGZ 21 generates continuous Burst or ESD-like interference pulses with a rising edge time of 2 ns and a falling edge time of approx. 10 ns. These pulses contain less energy than a 2/50 ns Burst pulse [according to EN 61000-4-4] or an ESD [according to EN 61000-4-2] pulse and can therefore be coupled directly into the electronic module without damaging the device under test. without damaging the device under test, coupling the interference directly into the electronic module. Since the pulses generated by the SGZ 21 have a short rising edge time and a low peak voltage, the effect of these disturbances on the DUT is similar to that of the Burst pulses of EN61000-4-4.

2.2 MS02 magnetic field probe

The MS02 is a passive probe that requires no additional energy and is connected to the SGZ 21 input via fiber optics.

If the MS02 detects a magnetic field pulse, it emits a light pulse. The number of light pulses, which can be read on the SGZ 21 counter, is a value proportional to the measured average magnetic field strength. Refer to the pulse rate test method for details

2.3 S31 sensors

Interference currents flowing through the EUT generate a magnetic field. Information on the strength and direction of the magnetic field provides information on the distribution of the interfering current.The E1 contains an MS02 magnetic field probe.

The MS02 is a passive probe that requires no additional energy and is connected to the SGZ 21 input via fiber optics. If the MS02 detects a magnetic field pulse, it emits a light pulse. The number of light pulses, which can be read on the SGZ 21 counter

to, this value is proportional to the measured average magnetic field strength. Refer to the pulse rate test method for details (see section 2.5 Contents).

Technical parameters of the E1 set:

E1 set Physical Test Diagram of Anti-jamming Development System

Other products recommended:

E1 SET for EMS rectification, for EMI rectification please check the following products:

6GHz Near Field Probe: XF1 set LANGER-EMV Passive Near Field Probe 30MHz-6GHz

20 GHz Near Field Probe is now available: SX1 SET LANGER-EMV Passive Near Field Probe 1GHz-10(20)GHz

40 GHz near-field probe is now available: HR-E 40-1 set langer-emv magnetic near-field probe 40 GHz